Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof

An apparatus for detecting an atomic structure of a sample along a surface thereof, said apparatus comprising:

• means for arranging said sample in a constant magnetic field (B.sub.0) of predetermined field strength and high homogeneity, said constant magnetic field (B.sub.0) having a first direction;
• first means for irradiating a first high-frequency magnetic field (B.sub.1) of a first predetermined frequency on said sample, said first high-frequency magnetic field (B.sub.1) having a second direction perpendicular to said first direction;
• means for providing a force-sensitive sensor having a paramagnetic tip comprising a paramagnetic spin at a terminal end of said paramagnetic tip, said spin being accessible for electron paramagnetic resonance, (EPR) excitation;
• means for placing said sensor in close vicinity to said sample such that said sensor tip is in atomic interaction with said sample surface;
• means for setting said predetermined field strength and said first predetermined frequency such that EPR is excited within said paramagnetic material;
• means for displacing said paramagnetic tip parallel to said sample surface for mapping predetermined points on said sample surface;
• and
• means for measuring the force exerted on said paramagnetic tip by a local inhomogeneous magnetic field (B.sub.loc) caused by atomic magnetic moments (m.sub.e,k) of said sample during said step of displacing.