G01Q 60/58
Sthm [scanning thermal microscopy] or apparatus therefor
Official title: SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes
G01Q60/58 (Sthm [scanning thermal microscopy] or apparatus therefor) appears on 75 US grants and 59 published applications in this corpus.
Search patents in G01Q- Granted patents
- 75
- Published applications
- 59
- Assignees
- 55
- Inventors
- 169
- Latest grant
- 16 Jul 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 3 | 0 |
| 1999 | 5 | 0 |
| 2000 | 1 | 0 |
| 2001 | 3 | 0 |
| 2002 | 5 | 1 |
| 2003 | 2 | 1 |
| 2004 | 1 | 2 |
| 2005 | 2 | 2 |
| 2006 | 2 | 4 |
| 2007 | 2 | 4 |
| 2008 | 4 | 1 |
| 2009 | 3 | 2 |
| 2010 | 3 | 3 |
| 2011 | 1 | 3 |
| 2012 | 2 | 3 |
| 2013 | 7 | 6 |
| 2014 | 2 | 3 |
| 2015 | 1 | 2 |
| 2016 | 3 | 0 |
| 2017 | 1 | 1 |
| 2018 | 0 | 4 |
| 2019 | 3 | 2 |
| 2020 | 2 | 2 |
| 2021 | 3 | 6 |
| 2022 | 4 | 1 |
| 2023 | 2 | 1 |
| 2024 | 2 | 2 |
| 2025 | 0 | 1 |
| 2026 | 0 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source16 Jul 2024US 12,038,455 B2Park Systems Corp.
- Self-packing three-arm thermal scanning probe for micro-nano manufacturing30 Apr 2024US 11,970,392 B2Zhejiang University
- Quantum-dot-based measuring system and method9 May 2023US 11,644,479 B2Shanghai University
- Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source7 Mar 2023US 11,598,788 B2Park Systems Corp.
- Multifunctional nanoprobes for scanning probe microscopy27 Sep 2022US 11,454,648 B2Getec Microscopy GmbH
- Nano-Probe Thermoreflectance Microscopy17 Sep 2026US 2026/0276672 A1Laser Thermal Analysis, Inc.
- A probing device comprising a heat transfer arrangement, a method of manufacturing a probing device, and a method for probing a sample30 Jul 2026US 2026/0219296 A1Teknologian tutkimuskeskus VTT Oy
- Device for nanoscale thermal measurements and associated method for manufacturing said device20 Mar 2025US 2025/0093212 A1Centre National De La Recherche Scientifique
- Detection probe, probe microscope, and sample temperature measuring method22 Aug 2024US 2024/0280606 A1Hitachi, Ltd.
- Self-packing three-arm thermal scanning probe for micro-nano manufacturing4 Jan 2024US 2024/0002220 A1Zhejiang University
Most cited
By later US patents
- Thermal sensing scanning probe microscope and method for measurement of thermal parameters of a specimen142US 5,441,343 ATopometrix · 1995
- Scanning thermal profiler117US 4,747,698 AInternational Business Machines Corporation · 1988
- Object inspection and/or modification system and method89US 6,337,479 B12002
- Object inspection and/or modification system and method74US 6,353,219 B12002
- Cantilever and measuring apparatus using it67US 5,929,438 ANikon Corporation · 1999