Multifunctional nanoprobes for scanning probe microscopy
AssigneeGetec Microscopy GmbH
InventorsHarald Plank, Jurgen Sattelkow, Robert Winkler, Christian Schwalb
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AssigneeGetec Microscopy GmbH
InventorsHarald Plank, Jurgen Sattelkow, Robert Winkler, Christian Schwalb
Estimating the term…
A multi-functional scanning probe microscopy nanoprobe may include a cantilever, a tapered structure formed on a surface of the cantilever from a first material, and a nanopillar formed on an apex of the tapered structure from a second material. One of the first and second materials may exhibit ferromagnetism and the other may have greater electrical conductivity. A method of simultaneous multi-mode operation during scanning probe microscopy may include scanning a sample with the nanoprobe in contact with the sample to produce a current measurement indicative of an electric current flowing through the sample and a height measurement indicative of a topography of the sample and, thereafter, scanning the sample with the nanoprobe oscillating about a lift height derived from the height measurement to produce a deflection measurement (e.g. phase shift) indicative of a magnetic force between the sample and the nanoprobe.
A multi-functional scanning probe microscopy nanoprobe comprising:
A method of simultaneous multi-mode operation during scanning probe microscopy, the method comprising:
A multi-functional scanning probe microscopy nanoprobe comprising:
A method of fabricating a multi-functional scanning probe microscopy nanoprobe, the method comprising:
Dependencies are inferred from the claim text.