Thermal sensing scanning probe microscope and method for measurement of thermal parameters of a specimen
AssigneeTopometrix
InventorsRussell J. Pylkki, Marc Schuman, Paul E. West
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AssigneeTopometrix
InventorsRussell J. Pylkki, Marc Schuman, Paul E. West
Estimating the term…
The scanning thermal probe microscope measures a thermal parameter such as thermal conductivity or temperature of surface contours of a specimen with a thermal sensor maintained in thermal communication with the surface of the specimen and maintained at a temperature different than that of the specimen. The thermal sensor is disposed on the free end of a cantilever arm in thermal communication with the probe. A thermal feedback bridge circuit can maintain the thermal sensor at a constant temperature by heating or cooling the sensor, and provides a signal for determining the heat transfer between the probe and the specimen. The cantilever arm includes first and second legs of electrically conductive material, and the thermal sensor comprises a narrowed portion of the conducting material having a relatively high temperature coefficient of resistance.
A method for measuring a thermal parameter of a specimen with a scanning thermal probe microscope having a probe having a distal tip for maintaining thermal communication with surface contours along a surface of the specimen, and a thermal sensor in thermal communication with said probe for measuring said thermal parameter, comprising the steps of:
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