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US 2024/0280606 A1Published application
Detection probe, probe microscope, and sample temperature measuring method
AssigneeHitachi, Ltd.
InventorMasanari KOGUCHI
Life of this patent
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Abstract
Between a nitrogen-vacancy center and a support portion, a cut-off portion is provided that cuts off the nitrogen-vacancy center from the support portion.
Claims13
A detection probe of probe microscope measuring a temperature of a sample, the detection probe comprising:
- a probe including at least one nitrogen-vacancy center;
- and
- a support portion supporting the probe, wherein,
- the detection probe includes, between the nitrogen-vacancy center and the support portion, at least a cut-off portion cutting off the nitrogen-vacancy center from the support portion.
1 more element
A probe microscope measuring a temperature of a sample by scanning the sample using a detection probe, wherein
- the detection probe includes a probe including at least one nitrogen-vacancy center, and
- a support portion supporting the probe, and
- includes, between the nitrogen-vacancy center and the support portion, at least a cut-off portion cutting off the nitrogen-vacancy center from the support portion.
A sample temperature measuring method of measuring a temperature of a sample using a probe microscope scanning the sample using a detection probe, the method comprising:
- forming a detection probe using a probe including at least one nitrogen-vacancy center and a support portion supporting the probe;
- cutting off, from the support portion, a tip portion of the probe including the nitrogen-vacancy center;
- inserting the cut-off tip portion of the probe including the nitrogen-vacancy center, into the sample at a predetermined point to leave the tin portion in the sample;
- and
- measuring the temperature of the sample via the left nitrogen-vacancy center.
2 more elements
Dependencies are inferred from the claim text.