G01Q 60/363
Contact-mode afm
Official title: {Contact-mode AFM}
G01Q60/363 (Contact-mode afm) appears on 32 US grants and 31 published applications in this corpus.
Search patents in G01Q- Granted patents
- 32
- Published applications
- 31
- Assignees
- 28
- Inventors
- 94
- Latest grant
- 1 Jul 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 1 | 1 |
| 2011 | 1 | 3 |
| 2012 | 0 | 1 |
| 2013 | 2 | 3 |
| 2014 | 2 | 1 |
| 2015 | 0 | 1 |
| 2016 | 1 | 0 |
| 2017 | 1 | 0 |
| 2018 | 1 | 1 |
| 2019 | 0 | 3 |
| 2020 | 5 | 0 |
| 2021 | 1 | 6 |
| 2022 | 7 | 4 |
| 2023 | 0 | 0 |
| 2024 | 2 | 3 |
| 2025 | 2 | 2 |
By publication year. Applications have been published since 2001.
Recent patents
- Method, system and computer program for performing acoustic scanning probe microscopy1 Jul 2025US 12,345,737 B2Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Active bimodal AFM operation for measurements of optical interaction8 Apr 2025US 12,270,827 B2Attocube Systems AG
- Test apparatus and test method thereof17 Sep 2024US 12,092,656 B2Samsung Electronics Co., Ltd.
- Method and apparatus for nanoscale infrared absorption tomography2 Jan 2024US 11,860,087 B2The Board of Trustees of the University of Illinois
- Interconnect with nanotube fitting16 Aug 2022US 11,417,792 B1Meta Platforms Technologies, LLC
- Method of and scanning probe microscopy system for measuring a topography of a side wall of a structure on a surface of a substrate18 Dec 2025US 2025/0383369 A1Nearfield Instruments B.V.
- Probes, apparatuses and methods for use in scanning probe microscopy26 Jun 2025US 2025/0208163 A1Yeda Research and Development Co. Ltd.
- Test apparatus and test method thereof21 Nov 2024US 2024/0385220 A1
- Method, system and computer program for performing acoustic scanning probe microscopy4 Jul 2024US 2024/0219421 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- High-frequency enhanced electrochemical strain microscope and high-frequency enhanced electrochemical strain microscopy using the same21 Mar 2024US 2024/0094241 A1Tohoku University
Most cited
By later US patents
- Dual cantilever scanning probe microscope46US 6,028,305 AThe Board of Trustees of the Leland Stanford Jr. University · 2000
- Atomic force microscope42US 5,224,376 ADigital Instruments, Inc. · 1993
- Two dimensional profiling with a contact force atomic force microscope39US 5,347,854 AInternational Business Machines Corporation · 1994
- Atomic force microscope33US 5,237,859 ADigital Instruments, Inc. · 1993
- Atomic force microscope33US 5,329,808 ADigital Instruments, Inc. · 1994