Dual cantilever scanning probe microscope

An scanning probe microscope comprising:

• a microscope body;
• a first probe configured to interact with and measure characteristics of surfaces within an effective measurement distance of said first probe, wherein said first probe is a contact type probe which is configured to interact with and measure said characteristics of said surfaces by contacting said surface;
• a first mechanism configured to position said first probe over a first point of a surface of a sample within said effective measurement distance, wherein said first mechanism is a first actuator having a first and second end, said first actuator coupled to said microscope body at said first end of said first actuator and coupled to said first probe at said second end of said first actuator;
• a second probe, wherein said second probe comprises a second contact type probe, said second contact type probe comprising a second tip, said effective measurement distance being zero in that said second contact type probe cannot measure characteristics of said surface of said sample without actually contacting said surface of said sample;
• a second mechanism configured to contact and remove said second probe to and from said surface of said sample at a second point, wherein said second point is separated from said first point by a predetermined distance in a predetermined direction, wherein said second mechanism is a second actuator having a first and second end, said second actuator coupled to said microscope body at said first end of said second actuator and coupled to said second probe at said second end of said second actuator, wherein said second tip is sharper than said first tip;
• and
• a third mechanism configured to move said second probe said predetermined distance in said predetermined direction, said third mechanism comprising:
• a scanner configured to receive, interpret, and respond to data representing movement instructions to move said scanner said predetermined distance in said first direction, said scanner comprising piezoelectric tubes;
• and
• a controller configured to send said data to said scanner.

A method for probing a surface of a sample comprising:

• contacting a first probe comprising a first contact end to a surface of said sample at said first contact end;
• after contacting a first probe, moving said first probe along said surface until said first contact end contacts a target point on said surface;
• and
• after moving said first probe, contacting a second probe comprising a second contact end to said target point at said second contact end, said second probe being a fixed distance from said first probe in a first direction.

A scanning probe microscope comprising:

• a first cantilever coupled to a first actuator, said first actuator being for driving said first cantilever between a raised position and a lowered position, a tip of said first cantilever being closest to a surface of a sample when said first cantilever is in said lowered position;
• a second cantilever coupled to a second actuator, said second actuator being for driving said second cantilever between a raised position and a lowered position, a tip of said second cantilever being closest to said surface of said sample when said second cantilever is in said lowered position;
• and
• a control unit for controlling said first and second actuators such that said first cantilever is in said lowered position when said second cantilever is in said raised position.

A method of analyzing a sample comprising the steps of:

• providing a scanning probe microscope, said scanning probe microscope having first and second cantilevers with first and second tips, respectively, separated by a fixed predetermined distance;
• positioning said cantilevers such that said first tip is within an effective measurement distance of said sample and said second tip is spaced apart from said sample;
• causing relative motion between said cantilevers and said sample such that said first tip arrives over a first location on said sample;
• positioning said cantilevers such that said first tip is spaced apart from said sample and said second tip is adjacent said sample;
• scanning said sample with said second tip so as to generate a representation of a property of said sample.