G01Q 60/366
Nanoindenters, i.e. wherein the indenting force is measured
Official title: {Nanoindenters, i.e. wherein the indenting force is measured}
G01Q60/366 (Nanoindenters, i.e. wherein the indenting force is measured) appears on 81 US grants and 77 published applications in this corpus.
Search patents in G01Q- Granted patents
- 81
- Published applications
- 77
- Assignees
- 49
- Inventors
- 185
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 1 | 3 |
| 2006 | 2 | 2 |
| 2007 | 1 | 3 |
| 2008 | 2 | 2 |
| 2009 | 1 | 5 |
| 2010 | 6 | 6 |
| 2011 | 3 | 4 |
| 2012 | 3 | 2 |
| 2013 | 3 | 8 |
| 2014 | 7 | 7 |
| 2015 | 6 | 5 |
| 2016 | 6 | 3 |
| 2017 | 4 | 2 |
| 2018 | 4 | 1 |
| 2019 | 2 | 4 |
| 2020 | 1 | 3 |
| 2021 | 2 | 2 |
| 2022 | 6 | 5 |
| 2023 | 5 | 4 |
| 2024 | 3 | 2 |
| 2025 | 2 | 2 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Indentation head for an indentation instrument16 Jun 2026US 12,656,233 B2Anton Paar Tritec SA
- Methods of producing single photon emitters on substrates, and devices, and chips10 Mar 2026US 12,575,225 B2Purdue Research Foundation
- Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)4 Mar 2025US 12,241,911 B2Bruker Nano, Inc.
- Nanomechanical profiling of breast cancer molecular subtypes14 Jan 2025US 12,196,740 B2UniversitäT Basel
- Large radius probe9 Apr 2024US 11,953,517 B2Bruker Nano, Inc.
- Methods of producing single photon emitters on substrates, and devices, and chips7 May 2026US 2026/0130011 A1Purdue Research Foundation
- Controlled Indentation Instrumentation Working in Dynamical Mechanical Analysis Mode4 Dec 2025US 2025/0370002 A1
- Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)8 May 2025US 2025/0147066 A1Bruker Nano, Inc.
- Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)30 May 2024US 2024/0175895 A1Bruker Nano, Inc.
- Indentation head for an indentation instrument22 Feb 2024US 2024/0060866 A1Anton Paar Tritec SA
Most cited
By later US patents
- Multi-dimensional capacitive transducer146US 5,869,751 AHysitron, Inc. · 1999
- Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system65US 5,553,486 AHysitron, Inc. · 1996
- Multi-dimensional capacitive transducer52US 5,661,235 AHysitron, Inc. · 1997
- Capacitive transducer with electrostatic actuation39US 5,576,483 AHysitron, Inc. · 1996
- MEMS nanoindenter36US 7,654,159 B2Nanofactory Instruments AB · 2010