G01Q 60/38
Probes, their manufacture, or their related instrumentation
Official title: Probes, their manufacture, or their related instrumentation, e.g. holders
G01Q60/38 (Probes, their manufacture, or their related instrumentation) appears on 667 US grants and 599 published applications in this corpus.
Search patents in G01Q- Granted patents
- 667
- Published applications
- 599
- Assignees
- 379
- Inventors
- 1,468
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 3 | 0 |
| 1990 | 3 | 0 |
| 1991 | 4 | 0 |
| 1992 | 2 | 0 |
| 1993 | 15 | 0 |
| 1994 | 20 | 0 |
| 1995 | 17 | 0 |
| 1996 | 14 | 0 |
| 1997 | 14 | 0 |
| 1998 | 20 | 0 |
| 1999 | 24 | 0 |
| 2000 | 19 | 0 |
| 2001 | 17 | 3 |
| 2002 | 16 | 14 |
| 2003 | 12 | 19 |
| 2004 | 13 | 7 |
| 2005 | 11 | 27 |
| 2006 | 21 | 33 |
| 2007 | 19 | 37 |
| 2008 | 28 | 44 |
| 2009 | 25 | 33 |
| 2010 | 25 | 34 |
| 2011 | 19 | 21 |
| 2012 | 22 | 22 |
| 2013 | 31 | 25 |
| 2014 | 34 | 20 |
| 2015 | 19 | 17 |
| 2016 | 16 | 23 |
| 2017 | 11 | 12 |
| 2018 | 18 | 22 |
| 2019 | 13 | 24 |
| 2020 | 25 | 29 |
| 2021 | 34 | 30 |
| 2022 | 19 | 19 |
| 2023 | 25 | 24 |
| 2024 | 14 | 22 |
| 2025 | 14 | 24 |
| 2026 | 10 | 14 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- In situ mechanical characterization of a sample strain29 Sep 2026US 12,748,129 B2NUtech Ventures
- Method of removing defect of mask15 Sep 2026US 12,736,870 B2Samsung Electronics Co., Ltd.
- Tip-enhanced spectroscopy7 Jul 2026US 12,674,746 B2Postech Research and Business Development Foundation
- System and method for scanning near-field optical microscopy23 Jun 2026US 12,663,435 B2Brown University
- Method and apparatus for measuring magnetic field strength26 May 2026US 12,638,522 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Multi-probe atomic force microscopy rotator24 Sep 2026US 2026/0287611 A1Laser Thermal Analysis, Inc.
- Multi-head afm for defect inspection and review24 Sep 2026US 2026/0287612 A1Nearfield Instruments B.V.
- Device for imaging and electrochemical sensing17 Sep 2026US 2026/0276574 A1The Board of Trustees of The University of Alabama
- Method of analyzing a probe tip deflection signal of a scanning probe microscopy system27 Aug 2026US 2026/0251676 A1Nearfield Instruments B.V.
- Single-crystal diamond probe cantilever for high-speed atomic force microscope and fabrication thereof27 Aug 2026US 2026/0251677 A1Institute of Physics, Chinese Academy of Sciences
Most cited
By later US patents
- Force sensing probe for scanning probe microscopy602US 6,121,611 AArizona Board of Regents · 2000
- Atomic force microscope and method for imaging surfaces with atomic resolution171US 4,724,318 AInternational Business Machines Corporation · 1988
- Near field scanning optical and force microscope including cantilever and optical waveguide136US 5,354,985 AStanford University · 1994
- Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device135US 6,628,053 B1Canon Kabushiki Kaisha · 2003
- Method of preparing probes for sensing and manipulating microscopic environments and structures110US 5,824,470 ACalifornia Institute of Technology · 1998