G01Q 60/30
Scanning potential microscopy
G01Q60/30 (Scanning potential microscopy) appears on 207 US grants and 187 published applications in this corpus.
Search patents in G01Q- Granted patents
- 207
- Published applications
- 187
- Assignees
- 140
- Inventors
- 479
- Latest grant
- 23 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 6 | 0 |
| 1999 | 7 | 0 |
| 2000 | 5 | 0 |
| 2001 | 6 | 0 |
| 2002 | 6 | 4 |
| 2003 | 4 | 5 |
| 2004 | 5 | 7 |
| 2005 | 4 | 8 |
| 2006 | 8 | 7 |
| 2007 | 6 | 9 |
| 2008 | 8 | 9 |
| 2009 | 3 | 7 |
| 2010 | 9 | 6 |
| 2011 | 6 | 3 |
| 2012 | 5 | 6 |
| 2013 | 3 | 6 |
| 2014 | 11 | 11 |
| 2015 | 3 | 9 |
| 2016 | 7 | 15 |
| 2017 | 9 | 7 |
| 2018 | 9 | 7 |
| 2019 | 12 | 18 |
| 2020 | 15 | 10 |
| 2021 | 16 | 9 |
| 2022 | 7 | 7 |
| 2023 | 7 | 4 |
| 2024 | 3 | 5 |
| 2025 | 5 | 4 |
| 2026 | 3 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for scanning near-field optical microscopy23 Jun 2026US 12,663,435 B2Brown University
- Measurement system with detection mechanism and method of operation thereof24 Mar 2026US 12,584,866 B1Park Systems Corp.
- Measurement system with detection mechanism and method of operation thereof24 Mar 2026US 12,584,942 B1Park Systems Corp.
- Method and apparatus for measuring electrical properties of sample material, device and medium16 Sep 2025US 12,416,657 B2Beijing Institute of Nanoenergy and Nanosystems
- Manufacturing process with atomic level inspection9 Sep 2025US 12,412,787 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Vibration component measuring device, kelvin probe force spectrometer, vibration component measuring method, and interface state density measuring method3 Sep 2026US 2026/0259247 A1Osaka University
- Method of manufacturing dry electrode and battery manufactured thereby25 Jun 2026US 2026/0179902 A1Hyundai Motor Company
- Method and apparatus for measuring diffused charges18 Jun 2026US 2026/0169027 A1Korea Advanced Institute of Science and Technology
- Method for detecting semiconductor carriers using a nanometer-scale microwave probe integrated with an atomic force microscope7 May 2026US 2026/0126468 A1National Cheng Kung University
- Dry Electrode Including Mixed Powder for Electrode28 Aug 2025US 2025/0273667 A1LG Energy Solution, Ltd.
Most cited
By later US patents
- Double cantilever sensor for atomic force microscope104US 5,267,471 AIBM Corporation · 1993
- Dynamically adjustable probe tips100US 7,022,976 B1Advanced Micro Devices, Inc. · 2006
- Cantilever deflection sensor and use thereof64US 5,804,709 AInternational Business Machines Corporation · 1998
- Method of etching a pattern on a substrate using a scanning probe microscope52US 5,618,760 AThe Board of Trustees of the Leland Stanford Jr. University · 1997
- Silicided silicon microtips for scanning probe microscopy45US 6,198,300 B1International Business Machines Corporation · 2001