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US 7,022,976 B1Granted
Dynamically adjustable probe tips
AssigneeAdvanced Micro Devices, Inc.
InventorsMiguel Santana, Jr., Robert Powell
Life of this patent
Estimating the term…
Abstract
Various probe systems and probes are provided. In one aspect, a probe is provided that includes a base and a first member coupled to the base. The first member has a first tip for probing a circuit device. A first actuator is coupled to the first member for moving the first member relative to the base. Electrical and/or topographical probing is possible.
Claims21
A probe, comprising:
- a base;
- a first member pivotally coupled to the base, the first member having a slot and a pin positioned therein to couple the first member to the base and a first tip for probing a circuit device;
- and
- a first actuator coupled to the first member for pivotally moving the first member relative to the base.
1 more element
A probe, comprising:
- a base;
- a first member pivotally coupled to the base, the first member having a slot and a pin positioned therein to couple the first member to the base and a first tip for probing a circuit device;
- and
- a second member pivotally coupled to the base, the second member having a second tip for probing the circuit device, the first and second members being positionable such that the first and second tips have substantially the same spatial relationship as two circuit structures of interest on the circuit device.
1 more element
A probe system, comprising:
- a base;
- a first member pivotally coupled to the base, the first member having a slot and a pin positioned therein to couple the first member to the base and a first tip for probing a circuit device;
- a first actuator coupled to the first member for pivotally moving the first member relative to the base;
- and
- an instrument coupled to the base, the instrument being operable to sense responses when the first probe tip encounters the circuit device.
2 more elements
Dependencies are inferred from the claim text.