Vibration component measuring device, kelvin probe force spectrometer, vibration component measuring method, and interface state density measuring method
AssigneeOsaka University
InventorYasuhiro SUGAWARA
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AssigneeOsaka University
InventorYasuhiro SUGAWARA
Estimating the term…
In order to more efficiently measure a change in a varying component of a vibration section and to more efficiently calculate an interface state density of a sample, a vibration component measuring device (2) includes: a vibration section (4); a vibration control section (10) configured to cause the vibration section to vibrate on the basis of a first AC signal; a signal applying section (14, 48) configured to apply, between the vibration section and the sample, a DC signal and at least one selected from the group consisting of a second AC signal and a reference AC signal; and a measuring section (42, 44) configured to measure the varying component of vibration of the vibration section. The measuring section measures a change in the varying component relative to a change in voltage value of the DC signal.
A vibration component measuring device comprising:
A vibration component measuring device comprising:
A vibration component measuring device comprising:
A method for measuring a vibration component, comprising the steps of:
A method for measuring a vibration component, comprising the steps of:
A method for measuring a vibration component, comprising the steps of:
Dependencies are inferred from the claim text.