G01Q 60/32
Ac mode
Official title: AC mode
G01Q60/32 (Ac mode) appears on 369 US grants and 353 published applications in this corpus.
Search patents in G01Q- Granted patents
- 369
- Published applications
- 353
- Assignees
- 190
- Inventors
- 620
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 5 | 0 |
| 1996 | 5 | 0 |
| 1997 | 8 | 0 |
| 1998 | 5 | 0 |
| 1999 | 11 | 0 |
| 2000 | 9 | 0 |
| 2001 | 9 | 2 |
| 2002 | 4 | 8 |
| 2003 | 5 | 10 |
| 2004 | 9 | 11 |
| 2005 | 6 | 15 |
| 2006 | 12 | 20 |
| 2007 | 12 | 16 |
| 2008 | 16 | 21 |
| 2009 | 15 | 16 |
| 2010 | 14 | 18 |
| 2011 | 23 | 22 |
| 2012 | 11 | 14 |
| 2013 | 21 | 12 |
| 2014 | 15 | 13 |
| 2015 | 15 | 14 |
| 2016 | 13 | 17 |
| 2017 | 14 | 10 |
| 2018 | 15 | 15 |
| 2019 | 10 | 18 |
| 2020 | 16 | 15 |
| 2021 | 19 | 14 |
| 2022 | 13 | 17 |
| 2023 | 13 | 10 |
| 2024 | 9 | 8 |
| 2025 | 7 | 10 |
| 2026 | 5 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Decoupled optical force nanoscopy6 Oct 2026US 12,754,207 B2The Board of Trustees of the University of Illinois
- Tip-enhanced spectroscopy7 Jul 2026US 12,674,746 B2Postech Research and Business Development Foundation
- Measurement system with detection mechanism and method of operation thereof24 Mar 2026US 12,584,942 B1Park Systems Corp.
- Transitional tapping atomic force microscopy for high-resolution imaging24 Feb 2026US 12,560,626 B2UTI Limited Partnership
- Method of monitoring at least one of an overlay or an alignment between layers of a semiconductor substrate, scanning probe microscopy system and computer program13 Jan 2026US 12,523,676 B2Nearfield Instruments B.V.
- Method for evaluating corrosion resistance of aluminum sheet1 Oct 2026US 2026/0298799 A1Honda Motor Co., Ltd.
- Afm device and method1 Oct 2026US 2026/0298972 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Vibration component measuring device, kelvin probe force spectrometer, vibration component measuring method, and interface state density measuring method3 Sep 2026US 2026/0259247 A1Osaka University
- Metrology method and associated metrology device6 Aug 2026US 2026/0227426 A1ASML Netherlands B. V.
- Scanning and micro-mass imaging technology using probe28 May 2026US 2026/0147014 A1Nanchang Hangkong University
Most cited
By later US patents
- Tapping atomic force microscope140US 5,412,980 ADigital Instruments, Inc. · 1995
- Jumping probe microscope123US 5,266,801 ADigital Instruments, Inc. · 1993
- Tapping atomic force microscope with phase or frequency detection109US 5,519,212 ADigital Instruments, Inc. · 1996
- Atomic force microscope for high speed imaging including integral actuator and sensor99US 5,883,705 AThe Board of Trustees of the Leland Stanford Jr. University · 1999
- Near field acoustic ultrasonic microscope system and method94US 5,319,977 AThe Board of Trustees of the Leland Stanford Junior University · 1994