Scanning and micro-mass imaging technology using probe

A scanning and micro-mass imaging technology using a probe, comprising a probe, a probe moving module, an optical microscopic measurement module, an oscillation excitation module, a probe position measurement module, a quartz crystal oscillator, an oscillation signal collection module, a speed-sensitive switch, an integration cell, a software processing module, and a sample, wherein the probe is placed perpendicularly, a top end of the probe has a dual-electrode mode of an electrode S1 and an electrode S2, and the quartz crystal oscillator is coated with the sample;

• the probe is used for generating an electromagnetic field signal for excitation of micro-region oscillation of the quartz crystal oscillator and receiving an electromagnetic field signal for oscillation attenuation of the quartz crystal oscillator;
• the probe moving module is capable of moving in three directions of x, y and z axes;
• the optical microscopic measurement module is used for measuring a perpendicular distance between the probe and the quartz crystal oscillator;
• the oscillation excitation module is used for sending a high-frequency oscillation signal to excite micro-region oscillation of the quartz crystal oscillator through the probe;
• the probe position measurement module is used for measuring dot matrix coordinate information of a position of the probe;
• the speed-sensitive switch is used for quickly shutting off an excitation signal of the oscillation excitation module;
• the oscillation signal collection module is used for collecting an oscillation amplitude and frequency of the quartz crystal oscillator;
• the integration cell is one of a gaseous phase cell, a liquid phase cell, an electrochemistry cell, and a photo-electrochemistry cell, and is used for providing a reaction environment for changes of a micro-mass Δm and viscoelasticity ΔQ of the sample;
• and
• the software processing module is embedded with an envelope fitting equation, an underdamped equation, and a Sauerbrey equation for operation, and obtains Δmxiyj and ΔQxiyj information of an i×j dot matrix, wherein i denotes a quantity of test points in the direction of the x axis, and j denotes a quantity of test lines in the direction of the y axis;
• and
• further performs processing to obtain distribution images of the micro-mass and a dissipation factor of the sample on a surface of the quartz crystal oscillator.