G01Q 60/26
Friction force microscopy
G01Q60/26 (Friction force microscopy) appears on 33 US grants and 26 published applications in this corpus.
Search patents in G01Q- Granted patents
- 33
- Published applications
- 26
- Assignees
- 34
- Inventors
- 88
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 1 |
| 2003 | 2 | 0 |
| 2004 | 0 | 1 |
| 2005 | 2 | 2 |
| 2006 | 1 | 3 |
| 2007 | 3 | 2 |
| 2008 | 2 | 1 |
| 2009 | 2 | 2 |
| 2010 | 2 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 1 |
| 2013 | 1 | 1 |
| 2014 | 1 | 0 |
| 2015 | 1 | 1 |
| 2016 | 1 | 3 |
| 2017 | 0 | 1 |
| 2018 | 1 | 1 |
| 2019 | 0 | 2 |
| 2020 | 3 | 0 |
| 2021 | 2 | 0 |
| 2022 | 0 | 1 |
| 2023 | 1 | 1 |
| 2024 | 0 | 1 |
| 2025 | 0 | 0 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- In situ mechanical characterization of a sample strain29 Sep 2026US 12,748,129 B2NUtech Ventures
- In situ mechanical characterization of a single cell-cell adhesion interface under large strain19 Dec 2023US 11,846,611 B2NUtech Ventures
- In situ tribometer and methods of use2 Feb 2021US 10,908,069 B2The Trustees of the University of Pennsylvania
- Method of controlling a probe using constant command signals19 Jan 2021US 10,895,584 B2Concept Scientifique Instruments
- Systems and methods for nano-tribological manufacturing of nanostructures8 Sep 2020US 10,768,202 B2The Trustees of the University of Pennsylvania
- Friction regulation method, apparatus and system for molybdenum disulfide12 Dec 2024US 2024/0410916 A1
- In situ mechanical characterization of a sample strain7 Dec 2023US 2023/0393170 A1Board of Regents of the University of Nebraska
- In situ mechanical characterization of a single cell-cell adhesion interface under large strain17 Mar 2022US 2022/0082483 A1NUtech Ventures
- Methods for designing and processing a microcantilever-based probe with an irregular cross section applied in an ultra-low friction coefficient measurement at a nanoscale single-point contact4 Jul 2019US 2019/0204353 A1Southwest Jiaotong University
- Method of controlling a probe28 Mar 2019US 2019/0094267 A1Concept Scientifique Instruments
Most cited
By later US patents
- Scanning microscope comprising force-sensing means and position-sensitive photodetector95US 5,254,854 AAT&T Bell Laboratories · 1993
- Directional atomic force microscope and method of observing a sample with the microscope91US 5,503,010 AAgency of Industrial Science and Technology · 1996
- Surface observing apparatus and method88US 5,436,448 AHitachi, Ltd. · 1995
- Method and device for simultaneously determining the adhesion, friction, and other material properties of a sample surface42US 6,880,386 B1Witec Wissenschaftliche Instrumente und Technologie GmbH · 2005
- Methods of operating atomic force microscopes to measure friction35US 5,400,647 ADigital Instruments, Inc. · 1995