Method and device for simultaneously determining the adhesion, friction, and other material properties of a sample surface

A raster probe microscope for the examination of sample surfaces, comprising:

• a raster probe;
• a holding device for a sample with the sample surface to be examined;
• an arrangement for moving the raster probe and/or the sample by which the probe and sample can be brought into contact so that they interact with one another in a given manner;
• an arrangement for detecting the relative movement of the probe and sample;
• an arrangement for controlling the movement of the raster probe and/or sample and for exciting a vertical first raster probe and/or sample oscillation and for exciting at least one of a vertical and horizontal second raster probe and/or sample oscillation;
• and
• an arrangement for detecting at least one of a vertical and lateral deformation of the raster probe in a vertical first oscillation and at least one of a vertical and horizontal second oscillation;
• the arrangement for detecting deformation recording two measuring signals characterizing the deformation of the raster probe in a vertical first oscillation and at least one of a vertical and horizontal second oscillation of the raster probe and/or sample, and characterized by periodic raster-probe and/or sample oscillations,
• wherein the vertical oscillation of the raster probe and/or the sample occurs with a first frequency of at least 10 Hz and a first amplitude of at least 1 nm;
• wherein the vertical oscillation of the raster probe and/or of the sample is additionally excited or modulated with a second frequency of at least 1 kHz and a second amplitude of at least 0.1 nm.