In situ tribometer and methods of use
AssigneeThe Trustees of the University of Pennsylvania
InventorsRobert W. Carpick, Nitya Nand Gosvami
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Abstract
Techniques for determining a characteristic of a sample using an atomic force microscope including a cantilever having a probe attached thereto, including positioning the sample within a cell and sliding the probe over a sliding zone of the sample within the cell. Lateral and vertical deformations of the cantilever are detected using the atomic force microscope as the probe is slid over the sliding zone. One or more characteristics are determined based on the detected lateral deformations of the cantilever.
Claims12
A tribometer for determining one or more characteristics of a surface of a sample, comprising:
- an atomic force microscope comprising a cantilever configured to detect lateral and vertical deformations of the cantilever;
- a probe attached to an end of the cantilever of the atomic force microscope, wherein the probe comprises a spherical structure;
- a cell for holding the sample with the surface comprising a sliding zone to be characterized;
- a control unit communicatively coupled with the atomic force microscope and configured to slide the probe over the sliding zone of the sample and determine the one or more characteristics based on a lateral deflection signal of the cantilever generated from the detected deformations of the cantilever, wherein the control unit is configured to simultaneously cause the probe to form an antiwear tribofilm within the sliding zone, image a topography of the sliding zone of the sample, and determine the one or more characteristics without removing the sample from the cell;
- and
- a heating element adapted to maintain the cell at a predetermined temperature.
A method for determining one or more characteristics of a surface of a sample using an atomic force microscope including a cantilever having a probe attached thereto, comprising:
- positioning the sample within a cell;
- sliding the probe over a sliding zone of the surface of the sample within the cell, wherein the probe comprises a spherical structure;
- detecting lateral and vertical deformations of the cantilever using the atomic force microscope as the probe is slid over the sliding zone;
- determining one or more characteristics of the sliding zone based on the detected lateral deformations of the cantilever;
- maintaining the cell at a predetermined temperature using a heating element;
- and
- simultaneously forming an antiwear tribofilm within the sliding zone, imaging a topography of the sliding zone of the sample, and determining the one or more characteristics without removing the sample from the cell.
Dependencies are inferred from the claim text.