G11C 29/48
Arrangements in static stores specially adapted for testing by means external to
Official title: Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
G11C29/48 (Arrangements in static stores specially adapted for testing by means external to) appears on 1,169 US grants and 996 published applications in this corpus.
Search patents in G11C- Granted patents
- 1,169
- Published applications
- 996
- Assignees
- 268
- Inventors
- 1,894
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 2 | 0 |
| 1984 | 1 | 0 |
| 1985 | 2 | 0 |
| 1986 | 2 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 3 | 0 |
| 1993 | 7 | 0 |
| 1994 | 4 | 0 |
| 1995 | 12 | 0 |
| 1996 | 14 | 0 |
| 1997 | 20 | 0 |
| 1998 | 25 | 0 |
| 1999 | 33 | 0 |
| 2000 | 34 | 0 |
| 2001 | 40 | 24 |
| 2002 | 55 | 62 |
| 2003 | 48 | 57 |
| 2004 | 60 | 60 |
| 2005 | 40 | 64 |
| 2006 | 49 | 67 |
| 2007 | 63 | 60 |
| 2008 | 57 | 64 |
| 2009 | 47 | 70 |
| 2010 | 62 | 36 |
| 2011 | 63 | 42 |
| 2012 | 42 | 30 |
| 2013 | 24 | 25 |
| 2014 | 45 | 26 |
| 2015 | 22 | 18 |
| 2016 | 24 | 18 |
| 2017 | 20 | 21 |
| 2018 | 18 | 32 |
| 2019 | 30 | 38 |
| 2020 | 37 | 24 |
| 2021 | 31 | 45 |
| 2022 | 47 | 37 |
| 2023 | 31 | 19 |
| 2024 | 18 | 18 |
| 2025 | 17 | 18 |
| 2026 | 8 | 21 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor memory device with processing-in-memory using test circuitry16 Jun 2026US 12,658,273 B2Micron Technology, Inc.
- Memory system with redundant operation16 Jun 2026US 12,658,274 B2NXP USA, Inc.
- Memory system, debugging device, debugging method of memory system, and method of operating memory system5 May 2026US 12,620,451 B2Samsung Electronics Co., Ltd.
- Device and method for testing memory28 Apr 2026US 12,614,604 B2Hprobe
- Built-in self test circuit for segmented static random access memory (SRAM) array input/output24 Mar 2026US 12,584,961 B2STMicroelectronics International N. V.
- Semiconductor memory device with processing-in-memory using test circuitry8 Oct 2026US 2026/0311790 A1Micron Technology, Inc.
- Processor-based system supporting in-field testing using external dynamic random access memory (dram) for storing and accessing test scan data13 Aug 2026US 2026/0236363 A1Microsoft Technology Licensing, LLC
- Testing adapters, testing systems, and testing methods for memory apparatus13 Aug 2026US 2026/0237449 A1Yangtze Memory Technologies Co., Ltd.
- Memory system for detecting fault in signal transmission path23 Jul 2026US 2026/0212944 A1SK hynix Inc.
- Scan-path integrated circuit memory with output bus feedback9 Jul 2026US 2026/0196286 A1SambaNova Systems, Inc.
Most cited
By later US patents
- Method and apparatus for memory array compressed data testing482US 5,935,263 AMicron Technology, Inc. · 1999
- Semiconductor memory apparatus and test circuit therefor417US 8,873,272 B2SK hynix Inc. · 2014
- Semiconductor package using terminals formed on a conductive layer of a circuit board258US 6,040,622 ASanDisk Corporation · 2000
- System and method for self-testing and repair of memory modules168US 6,754,117 B2Micron Technology, Inc. · 2004
- Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad152US 5,506,499 ANeoMagic Corp. · 1996