G01R 31/31921
Using compression techniques
Official title: {using compression techniques, e.g. patterns sequencer}
G01R31/31921 (Using compression techniques) appears on 194 US grants and 84 published applications in this corpus.
Search patents in G01R- Granted patents
- 194
- Published applications
- 84
- Assignees
- 78
- Inventors
- 302
- Latest grant
- 19 Sep 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1979 | 1 | 0 |
| 1980 | 2 | 0 |
| 1981 | 3 | 0 |
| 1982 | 2 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 5 | 0 |
| 1986 | 2 | 0 |
| 1987 | 8 | 0 |
| 1988 | 4 | 0 |
| 1989 | 6 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 5 | 0 |
| 1993 | 4 | 0 |
| 1994 | 2 | 0 |
| 1995 | 6 | 0 |
| 1996 | 1 | 0 |
| 1997 | 6 | 0 |
| 1998 | 7 | 0 |
| 1999 | 11 | 0 |
| 2000 | 11 | 0 |
| 2001 | 8 | 5 |
| 2002 | 10 | 5 |
| 2003 | 8 | 6 |
| 2004 | 9 | 13 |
| 2005 | 2 | 7 |
| 2006 | 8 | 12 |
| 2007 | 10 | 5 |
| 2008 | 8 | 4 |
| 2009 | 11 | 6 |
| 2010 | 2 | 4 |
| 2011 | 5 | 2 |
| 2012 | 1 | 0 |
| 2013 | 2 | 0 |
| 2014 | 1 | 2 |
| 2015 | 1 | 2 |
| 2016 | 2 | 1 |
| 2017 | 4 | 1 |
| 2018 | 0 | 3 |
| 2019 | 2 | 1 |
| 2020 | 1 | 0 |
| 2021 | 2 | 1 |
| 2022 | 2 | 1 |
| 2023 | 2 | 3 |
By publication year. Applications have been published since 2001.
Recent patents
- Method of testing electronic circuits and corresponding circuit19 Sep 2023US 11,762,019 B2STMicroelectronics S,r.l.
- Programmable scan chain debug technique12 Sep 2023US 11,754,624 B1Seagate Technology LLC
- Method of testing electronic circuits and corresponding circuit15 Nov 2022US 11,500,021 B2STMicroelectronics S,r.l.
- Suspect resolution for scan chain defect diagnosis23 Aug 2022US 11,423,202 B2Siemens Industry Software Inc.
- Test scheduling and test access in test compression environment23 Mar 2021US 10,955,460 B2Mentor Graphics Corporation
- Programmable scan chain debug technique24 Aug 2023US 2023/0266388 A1Seagate Technology LLC
- Method of testing electronic circuits and corresponding circuit2 Feb 2023US 2023/0031516 A1STMicroelectronics S,r.l.
- Usage-aware compression for streaming data from a test and measurement instrument12 Jan 2023US 2023/0012393 A1Tektronix, Inc.
- Suspect resolution for scan chain defect diagnosis3 Mar 2022US 2022/0065932 A1Mentor Graphics Corporation
- Method of testing electronic circuits and corresponding circuit3 Jun 2021US 2021/0165043 A1STMicroelectronics S,r.l.
Most cited
By later US patents
- Method and device for compressing and expanding data pattern117US 6,661,839 B1Advantest Corporation · 2003
- Parallel compression test circuit of memory device84US 7,187,195 B2Hynix Semiconductor Inc. · 2007
- System for automatic testing of circuits and systems65US 4,656,632 AGiordano Associates, Inc. · 1987
- Automatic test system having a "true tester-per-pin" architecture64US 4,931,723 ASchlumberger Technologies, Inc. · 1990
- Test pattern generating apparatus62US 4,293,950 ANippon Telegraph & Telephone Public Corporation · 1981