G01R 31/318588
Security aspects
Official title: {Security aspects}
G01R31/318588 (Security aspects) appears on 73 US grants and 82 published applications in this corpus.
Search patents in G01R- Granted patents
- 73
- Published applications
- 82
- Assignees
- 60
- Inventors
- 179
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 1 | 1 |
| 2003 | 1 | 1 |
| 2004 | 0 | 1 |
| 2005 | 0 | 4 |
| 2006 | 1 | 1 |
| 2007 | 3 | 0 |
| 2008 | 0 | 1 |
| 2009 | 1 | 0 |
| 2010 | 1 | 1 |
| 2011 | 1 | 1 |
| 2012 | 0 | 4 |
| 2013 | 2 | 1 |
| 2014 | 3 | 1 |
| 2015 | 3 | 7 |
| 2016 | 2 | 5 |
| 2017 | 9 | 9 |
| 2018 | 3 | 4 |
| 2019 | 8 | 6 |
| 2020 | 7 | 5 |
| 2021 | 5 | 5 |
| 2022 | 4 | 3 |
| 2023 | 3 | 6 |
| 2024 | 8 | 8 |
| 2025 | 5 | 4 |
| 2026 | 2 | 3 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Secure scan testing of integrated circuits25 Aug 2026US 12,716,945 B2SK hynix Inc.
- Providing configurable security for intellectual property circuits of a processor14 Apr 2026US 12,601,785 B2Intel Corporation
- Scan flip-flop, scan chain circuit including the same, and control method of the scan flip-flop2 Dec 2025US 12,487,285 B2Research & Business Foundation Sungkyunkwan University
- Semiconductor integrated circuit, a method for testing the semiconductor integrated circuit, and a semiconductor system14 Oct 2025US 12,442,858 B2Samsung Electronics Co., Ltd.
- Scan chain security circuit and driving method thereof2 Sep 2025US 12,405,303 B2UIF (University Industry Foundation), Yonsei University
- Secure scan testing of integrated circuits28 May 2026US 2026/0147041 A1SK hynix Inc.
- Debug system and method for operating a debug system19 Mar 2026US 2026/0079205 A1PUFsecurity Corporation
- Scan Test Security for Semiconductor Devices5 Mar 2026US 2026/0063714 A1NVIDIA Corporation
- Debug infrastructure for memory systems23 Oct 2025US 2025/0327860 A1Micron Technology, Inc.
- Encryption of scan chain output25 Sep 2025US 2025/0300821 A1Advanced Micro Devices, Inc.
Most cited
By later US patents
- Method and apparatus for switchably selecting an integrated circuit operating mode48US 6,466,048 B1Mosaid Technologies Incorporated · 2002
- Secure design-for-test scan chains11US 8,438,436 B1Xilinx, Inc. · 2013
- Method and apparatus for selecting an encryption integrated circuit operating mode8US 6,664,803 B2Mosaid Technologies Incorporated · 2003
- Method and apparatus for selecting an encryption integrated circuit operating mode7US 7,009,419 B2Mosaid Technologies Incorporated · 2006
- Protection of proprietary embedded instruments7US 8,881,301 B2ASSET InterTech, Inc. · 2014