G01R 31/318575
Power distribution
Official title: {Power distribution; Power saving}
G01R31/318575 (Power distribution) appears on 290 US grants and 289 published applications in this corpus.
Search patents in G01R- Granted patents
- 290
- Published applications
- 289
- Assignees
- 93
- Inventors
- 421
- Latest grant
- 26 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 1 |
| 2002 | 1 | 6 |
| 2003 | 2 | 7 |
| 2004 | 7 | 5 |
| 2005 | 4 | 9 |
| 2006 | 8 | 13 |
| 2007 | 8 | 23 |
| 2008 | 13 | 18 |
| 2009 | 18 | 17 |
| 2010 | 17 | 16 |
| 2011 | 27 | 21 |
| 2012 | 11 | 14 |
| 2013 | 20 | 20 |
| 2014 | 20 | 19 |
| 2015 | 17 | 23 |
| 2016 | 18 | 10 |
| 2017 | 19 | 12 |
| 2018 | 13 | 8 |
| 2019 | 9 | 5 |
| 2020 | 11 | 11 |
| 2021 | 9 | 7 |
| 2022 | 11 | 4 |
| 2023 | 5 | 6 |
| 2024 | 4 | 5 |
| 2025 | 8 | 6 |
| 2026 | 4 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- High-throughput scan architecture26 May 2026US 12,638,503 B2Google Inc.
- Scan cell placing method and scan cell placing apparatus21 Apr 2026US 12,607,979 B2UIF (University Industry Foundation), Yonsei University
- Method for testing power leakage of circuit and processing system using same27 Jan 2026US 12,535,536 B2Realtek Semiconductor Corp.
- Power reduction and effective timing exceptions handling in at-speed capture6 Jan 2026US 12,517,544 B2STMicroelectronics International N. V.
- Power delivery network degradation detection in a computing device30 Dec 2025US 12,509,099 B2QUALCOMM Incorporated
- Clock gating based on care bits in scan chains for reduced clock power during scan automatic test pattern generation13 Aug 2026US 2026/0235674 A1
- Low-power scan-based testing for integrated circuit devices8 Jan 2026US 2026/0009847 A1Texas Instruments Incorporated
- Power management cluster design system and method using a no-code approach8 Jan 2026US 2026/0009850 A1Itda Semiconductor Co., Ltd.
- Test pattern reset control circuit11 Dec 2025US 2025/0377409 A1STMicroelectronics International N. V.
- Clock signal control for scan-chain testing4 Dec 2025US 2025/0370042 A1Texas Instruments Incorporated
Most cited
By later US patents
- Generator/compactor scan circuit low power adapter with counter68US 6,763,488 B2Texas Instruments Incorporated · 2004
- Integrated circuit built-in self-test structure31US 5,130,645 AVLSI Technology, Inc. · 1992
- Scan circuit low power adapter with counter31US 6,769,080 B2Texas Instruments Incorporated · 2004
- ECL test access port with low power control30US 5,379,302 ANational Semiconductor Corporation · 1995
- Reduced power testing with equally divided scan paths30US 6,519,729 B1Texas Instruments Incorporated · 2003