G01R 31/318566
Comparators
Official title: {Comparators; Diagnosing the device under test}
G01R31/318566 (Comparators) appears on 313 US grants and 281 published applications in this corpus.
Search patents in G01R- Granted patents
- 313
- Published applications
- 281
- Assignees
- 118
- Inventors
- 525
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 0 | 0 |
| 1987 | 4 | 0 |
| 1988 | 2 | 0 |
| 1989 | 3 | 0 |
| 1990 | 3 | 0 |
| 1991 | 3 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 3 | 0 |
| 1997 | 2 | 0 |
| 1998 | 4 | 0 |
| 1999 | 4 | 0 |
| 2000 | 2 | 0 |
| 2001 | 4 | 1 |
| 2002 | 2 | 5 |
| 2003 | 6 | 6 |
| 2004 | 5 | 10 |
| 2005 | 5 | 9 |
| 2006 | 9 | 20 |
| 2007 | 12 | 15 |
| 2008 | 9 | 8 |
| 2009 | 15 | 6 |
| 2010 | 11 | 12 |
| 2011 | 14 | 7 |
| 2012 | 6 | 6 |
| 2013 | 9 | 12 |
| 2014 | 9 | 11 |
| 2015 | 16 | 13 |
| 2016 | 9 | 16 |
| 2017 | 7 | 10 |
| 2018 | 15 | 14 |
| 2019 | 21 | 15 |
| 2020 | 13 | 12 |
| 2021 | 15 | 15 |
| 2022 | 21 | 13 |
| 2023 | 11 | 14 |
| 2024 | 16 | 11 |
| 2025 | 9 | 12 |
| 2026 | 5 | 8 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Secure scan testing of integrated circuits25 Aug 2026US 12,716,945 B2SK hynix Inc.
- Monitor circuit to determine integrated circuit condition based on diagnostic code sequence21 Jul 2026US 12,688,349 B2QUALCOMM Incorporated
- Methods and apparatus to identify faults in processors12 May 2026US 12,625,179 B2Texas Instruments Incorporated
- Diagnosing identical circuit blocks in data streaming environment7 Apr 2026US 12,596,149 B2Siemens Industry Software Inc.
- Multiple test modes for a memory in an integrated circuit3 Mar 2026US 12,567,476 B2SambaNova Systems, Inc.
- Integrated circuit including test circuit13 Aug 2026US 2026/0235666 A1Samsung Electronics Co., Ltd.
- Scan-path integrated circuit memory with output bus feedback9 Jul 2026US 2026/0196286 A1SambaNova Systems, Inc.
- Non-destructive fault detecting method and system using debug access ports25 Jun 2026US 2026/0177612 A1
- Secure scan testing of integrated circuits28 May 2026US 2026/0147041 A1SK hynix Inc.
- System and method for testing identical cores21 May 2026US 2026/0140178 A1NXP B. V.
Most cited
By later US patents
- Correlation of electrical test data with physical defect data433US 6,950,771 B1Xilinx, Inc. · 2005
- Self-testing multi-processor die with internal compare points185US 5,732,209 AExponential Technology, Inc. · 1998
- Microprocessor with a large cache shared by redundant CPUs for increasing manufacturing yield125US 5,828,578 AS3 Incorporated · 1998
- Weighted random pattern testing apparatus and method118US 4,801,870 AInternational Business Machines Corporation · 1989
- Weighted random pattern testing apparatus and method101US 4,687,988 AInternational Business Machines Corporation · 1987