G01R 31/318328
For delay tests
Official title: {for delay tests}
G01R31/318328 (For delay tests) appears on 107 US grants and 81 published applications in this corpus.
Search patents in G01R- Granted patents
- 107
- Published applications
- 81
- Assignees
- 76
- Inventors
- 251
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 3 | 0 |
| 1996 | 4 | 0 |
| 1997 | 3 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 3 | 0 |
| 2001 | 5 | 1 |
| 2002 | 2 | 2 |
| 2003 | 2 | 8 |
| 2004 | 6 | 7 |
| 2005 | 4 | 4 |
| 2006 | 7 | 4 |
| 2007 | 6 | 5 |
| 2008 | 3 | 6 |
| 2009 | 1 | 1 |
| 2010 | 3 | 5 |
| 2011 | 3 | 1 |
| 2012 | 5 | 3 |
| 2013 | 6 | 1 |
| 2014 | 0 | 1 |
| 2015 | 3 | 3 |
| 2016 | 1 | 1 |
| 2017 | 2 | 0 |
| 2018 | 2 | 3 |
| 2019 | 4 | 2 |
| 2020 | 4 | 4 |
| 2021 | 3 | 3 |
| 2022 | 4 | 3 |
| 2023 | 2 | 5 |
| 2024 | 7 | 3 |
| 2025 | 0 | 2 |
| 2026 | 4 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Delay measurement system and measurement method11 Aug 2026US 12,704,548 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Test and repair of interconnects between chips9 Jun 2026US 12,650,459 B2Intel Corporation
- Electronic device and method that applies stress to transistors14 Apr 2026US 12,603,651 B2SK hynix Inc.
- Built-in self test circuit for measuring performance of clock data recovery and system-on-chip including the same17 Feb 2026US 12,553,944 B2Samsung Electronics Co., Ltd.
- Delay measurement system and measurement method17 Dec 2024US 12,169,222 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Digital Glitch Sensor13 Aug 2026US 2026/0235672 A1Google Inc.
- Device and Method for Diagnosis of the Same25 Jun 2026US 2026/0177614 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Test pattern generating method and device1 Jan 2026US 2026/0002991 A1Samsung Electronics Co., Ltd.
- Electronic device and method that applies stress to transistors15 May 2025US 2025/0158613 A1SK hynix Inc.
- Delay measurement system and measurement method20 Feb 2025US 2025/0060410 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Network timing analysis method which eliminates timing variations between signals traversing a common circuit path58US 5,636,372 AInternational Business Machines Corporation · 1997
- Method and system for testing a sonet network element54US 5,455,832 ABell Communications Research, Inc. · 1995
- System and method for time slicing deterministic patterns for reseeding in logic built-in self-test34US 6,807,646 B1Synopsys, Inc. · 2004
- Critical path prediction for design of circuits33US 5,544,071 AIntel Corporation · 1996
- Simplified delay testing for LSI circuit faults32US 4,672,307 AUniversity of Southern California · 1987