G01R 31/2887
Involving moving the probe head or the ic under test
Official title: {involving moving the probe head or the IC under test; docking stations (moving single probes G01R1/06705; moving individual probes in multiple probes G01R1/07392)}
G01R31/2887 (Involving moving the probe head or the ic under test) appears on 884 US grants and 800 published applications in this corpus.
Search patents in G01R- Granted patents
- 884
- Published applications
- 800
- Assignees
- 318
- Inventors
- 1,547
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 2 | 0 |
| 1987 | 2 | 0 |
| 1988 | 2 | 0 |
| 1989 | 0 | 0 |
| 1990 | 3 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 4 | 0 |
| 1994 | 3 | 0 |
| 1995 | 7 | 0 |
| 1996 | 4 | 0 |
| 1997 | 14 | 0 |
| 1998 | 19 | 0 |
| 1999 | 24 | 0 |
| 2000 | 32 | 0 |
| 2001 | 27 | 11 |
| 2002 | 47 | 39 |
| 2003 | 21 | 39 |
| 2004 | 52 | 44 |
| 2005 | 38 | 45 |
| 2006 | 32 | 33 |
| 2007 | 31 | 29 |
| 2008 | 28 | 48 |
| 2009 | 33 | 26 |
| 2010 | 30 | 26 |
| 2011 | 19 | 23 |
| 2012 | 13 | 23 |
| 2013 | 14 | 20 |
| 2014 | 21 | 18 |
| 2015 | 20 | 31 |
| 2016 | 29 | 22 |
| 2017 | 26 | 20 |
| 2018 | 25 | 22 |
| 2019 | 24 | 27 |
| 2020 | 22 | 45 |
| 2021 | 40 | 41 |
| 2022 | 49 | 33 |
| 2023 | 33 | 42 |
| 2024 | 36 | 31 |
| 2025 | 28 | 32 |
| 2026 | 25 | 30 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Dynamic load pull tuner support for on-wafer testing22 Sep 2026US 12,742,818 B1
- Device handling apparatus and device testing apparatus15 Sep 2026US 12,736,582 B2Advantest Corporation
- Probe systems and methods of operating probe systems8 Sep 2026US 12,730,143 B2FormFactor, Inc.
- Wafer probing apparatus with probe card positioning module25 Aug 2026US 12,716,940 B2
- Diagnostic device18 Aug 2026US 12,710,472 B2The Boeing Company
- Testing device and method for testing an electronic device17 Sep 2026US 2026/0276701 A1JCET STATS ChipPAC Korea Limited
- Prober10 Sep 2026US 2026/0266897 A1Tokyo Seimitsu Co., Ltd.
- Moving Device, Inspection Device, and Moving Method27 Aug 2026US 2026/0251703 A1Tokyo Electron Limited
- Prober and probe inspection method6 Aug 2026US 2026/0227428 A1Tokyo Seimitsu Co., Ltd.
- Fast inspection of device under test30 Jul 2026US 2026/0219299 A1InZiv Ltd.
Most cited
By later US patents
- Method and apparatus for integrated wafer handling and testing404US 6,164,894 A2000
- Integrated testing method and apparatus for semiconductor test operations processing162US 6,137,303 ASony Corporation · 2000
- Probe apparatus with tilt correction mechanisms156US 5,804,983 ATokyo Electron Limited · 1998
- Method and apparatus for direct probe sensing150US 6,096,567 AElectroglas, Inc. · 2000
- Electronic test head positioner for test systems147US 4,705,447 AinTEST Corporation · 1987