G01R 31/2879
Related to electrical aspects
Official title: {related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads}
G01R31/2879 (Related to electrical aspects) appears on 458 US grants and 465 published applications in this corpus.
Search patents in G01R- Granted patents
- 458
- Published applications
- 465
- Assignees
- 235
- Inventors
- 1,094
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 1 | 0 |
| 1997 | 4 | 0 |
| 1998 | 3 | 0 |
| 1999 | 6 | 0 |
| 2000 | 7 | 0 |
| 2001 | 6 | 1 |
| 2002 | 13 | 13 |
| 2003 | 16 | 6 |
| 2004 | 9 | 11 |
| 2005 | 14 | 17 |
| 2006 | 10 | 9 |
| 2007 | 12 | 13 |
| 2008 | 9 | 14 |
| 2009 | 13 | 8 |
| 2010 | 7 | 5 |
| 2011 | 7 | 3 |
| 2012 | 4 | 5 |
| 2013 | 0 | 8 |
| 2014 | 12 | 12 |
| 2015 | 7 | 22 |
| 2016 | 14 | 12 |
| 2017 | 19 | 18 |
| 2018 | 25 | 27 |
| 2019 | 16 | 26 |
| 2020 | 30 | 28 |
| 2021 | 35 | 37 |
| 2022 | 38 | 34 |
| 2023 | 34 | 37 |
| 2024 | 30 | 30 |
| 2025 | 37 | 36 |
| 2026 | 14 | 33 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Parallel dipole line photo-hall system with temperature gradient stage15 Sep 2026US 12,736,580 B2International Business Machines Corporation
- Test device and semiconductor manufacturing apparatus including test device25 Aug 2026US 12,716,938 B2Samsung Electronics Co., Ltd.
- Semiconductor package18 Aug 2026US 12,710,471 B2Yangtze Memory Technologies Co., Ltd.
- Wafer analyzing device and wafer analyzing system11 Aug 2026US 12,704,543 B2SK hynix Inc.
- Test system, method of testing display cell using the same, and display device21 Jul 2026US 12,688,804 B2Samsung Display Co., Ltd.
- Test mode controller circuit controlling test functions for charge and discharge controller circuit1 Oct 2026US 2026/0299013 A1Nisshinbo Micro Devices Inc.
- Configuration of parallel testing systems24 Sep 2026US 2026/0287644 A1Chroma Ate Inc.
- Reliability test platform and probe pad assembly24 Sep 2026US 2026/0287647 A1MetaPWR Electronics Co., Ltd.
- Method of and sensing probe device for measuring a parameter of a quantum chip17 Sep 2026US 2026/0276675 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Carrier, inspection system, and inspection method3 Sep 2026US 2026/0259256 A1Tokyo Electron Limited
Most cited
By later US patents
- Method for manufacturing a stimulus wafer for use in a wafer-to-wafer testing system to test integrated circuits located on a product wafer173US 5,701,666 AMotorola, Inc. · 1997
- Systems and methods for implementing S/SSTDR measurements138US 9,244,117 B2LiveWire Innovation, Inc. · 2016
- Systems and methods for implementing S/SSTDR measurements133US 9,476,932 B2University of Utah Foundation · 2016
- Semiconductor wafer test and burn-in112US 5,600,257 AInternational Business Machines Corporation · 1997
- Device for probe card power bus noise reduction96US 7,005,879 B1International Business Machines Corporation · 2006