Reliability test platform and probe pad assembly

Abstract

The present invention discloses a comprehensive solution for a reliability test platform that satisfies the demands of high-current and dynamic response characteristics for the loads of DC/DC converter. Furthermore, by implementing energy feedback through the load assembly, the system significantly reduces losses on energy transmission path by recycling the majority of output energy back to the power grid. Additionally, the invention discloses a structural configuration for the test card that minimizes losses along the transmission path by setting the load assembly, the Device Under Test (DUT), and associated interconnects. The disclosed probe pad structure also addresses the need for high-output-current while reducing thermal losses and operational temperatures within the probe interface, thereby ensuring stable and reliable operation of the entire test platform.

Dependencies are inferred from the claim text.