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US 9,476,932 B2Granted
Systems and methods for implementing S/SSTDR measurements
AssigneeUniversity of Utah Foundation
InventorsCynthia Furse, Faisal Khan
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Abstract
Systems and methods which utilize spread spectrum sensing on live circuits to obtain information regarding a circuit under test are provided. In some embodiments S/SSTDR testing may be utilized to obtain R, L, C and Z measurements from circuit components. In yet further embodiments, these measurements may be utilized to monitor the output of sensors on a circuit.
Claims20
A method comprising:
- transmitting plural spread spectrum time domain reflectometry (S/SSTDR) signals onto a signal path of an electronic circuit;
- receiving plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit;
- receiving plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit;
- and
- processing the reflected signals from the known impedance and the reflections from the unknown component to determine an electrical property of an element of the electronic circuit.
2 more elements
An apparatus comprising:
- at least one processing device configured to:
- transmit plural spread spectrum time domain reflectometry (S/SSTDR) signals onto a signal path of an electronic circuit;
- receive plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit;
- receive plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit;
- and
- process the reflected signals from the known impedance and the reflected signals from the unknown component to determine an electrical property of an element of the electronic circuit.
3 more elements
An apparatus comprising:
- at least one processing device configured to form S/SSTDR test signals;
- and
- plural input/output ports configured to communicatively connect to a target to be tested;
- wherein the at least one processing device is configured to simultaneously:
- transmit plural spread spectrum time domain reflectometry (S/SSTDR) signals onto plural signal paths of an electronic circuit;
- receive plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit;
- receive plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit;
- and
- process the reflected signals from the known impedance and the reflected signals from the unknown component to determine an electrical property of an element of the electronic circuit.
6 more elements
Dependencies are inferred from the claim text.