G01R 31/2867
Handlers or transport devices
Official title: {Handlers or transport devices, e.g. loaders, carriers, trays}
G01R31/2867 (Handlers or transport devices) appears on 334 US grants and 361 published applications in this corpus.
Search patents in G01R- Granted patents
- 334
- Published applications
- 361
- Assignees
- 144
- Inventors
- 738
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 3 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 3 | 0 |
| 1993 | 3 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 2 | 0 |
| 1997 | 4 | 0 |
| 1998 | 7 | 0 |
| 1999 | 8 | 0 |
| 2000 | 8 | 0 |
| 2001 | 8 | 1 |
| 2002 | 6 | 6 |
| 2003 | 4 | 7 |
| 2004 | 3 | 13 |
| 2005 | 13 | 12 |
| 2006 | 10 | 9 |
| 2007 | 14 | 12 |
| 2008 | 7 | 11 |
| 2009 | 5 | 4 |
| 2010 | 3 | 11 |
| 2011 | 7 | 3 |
| 2012 | 5 | 5 |
| 2013 | 5 | 6 |
| 2014 | 4 | 10 |
| 2015 | 4 | 15 |
| 2016 | 11 | 12 |
| 2017 | 9 | 13 |
| 2018 | 10 | 17 |
| 2019 | 14 | 14 |
| 2020 | 21 | 31 |
| 2021 | 16 | 16 |
| 2022 | 25 | 31 |
| 2023 | 29 | 34 |
| 2024 | 22 | 19 |
| 2025 | 20 | 30 |
| 2026 | 11 | 19 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Test environment control system22 Sep 2026US 12,742,816 B2Yishi Industrial Co., Ltd
- Electronic component manufacturing method, manufacturing film, and manufacturing tool25 Aug 2026US 12,721,109 B2Mitsui Chemicals Ict Materia, Inc.
- Methods and devices for testing a device under test using test site specific thermal control signaling4 Aug 2026US 12,699,128 B2Advantest Corporation
- Method of having good thermal isolation in wafer test cassette26 May 2026US 12,638,497 B2Xingr Technologies (Zhejiang) Limited
- Modular and adjustable thermal load test vehicle19 May 2026US 12,631,681 B2Microsoft Technology Licensing, LLC
- Probe station device8 Oct 2026US 2026/0309769 A1Korea Basic Science Institute
- Carrier, inspection system, and inspection method3 Sep 2026US 2026/0259256 A1Tokyo Electron Limited
- A new type of pre-conditioning tray for testing electronic components20 Aug 2026US 2026/0243819 A1Microtest S.p.A.
- Semiconductor testing device and inspection system2 Jul 2026US 2026/0186017 A1Kabushiki Kaisha Nihon Micronics
- Semiconductor testing device2 Jul 2026US 2026/0186046 A1Kabushiki Kaisha Nihon Micronics
Most cited
By later US patents
- Method and apparatus for the transport and tracking of an electronic component149US 6,644,982 B1FormFactor, Inc. · 2003
- Method for mounting an electronic component113US 6,627,483 B2FormFactor, Inc. · 2003
- Temperature stable cryogenic probe station108US 5,097,207 AJohn H. Blanz Company, Inc. · 1992
- Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method98US 5,945,834 AMatsushita Electric Industrial Co., Ltd. · 1999
- Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method86US 6,005,401 AMatsushita Electric Industrial Co., Ltd. · 1999