Semiconductor testing device and inspection system

A semiconductor testing device comprising:

• a housing which has a plurality of slots;
• a plurality of circuit board units that are arranged so as to face one another in a horizontal direction, and are placed inside the housing by having each circuit board unit inserted from above into each of the slots;
• a guide member provided so as to extend in a top-bottom direction in each of the slots, having grooves through which side edges of each of the circuit board units is inserted;
• and
• a block member, which is located above each of the guide members, and is provided so as to extend along an arrangement direction of each of the circuit board units so as to overlap with the plurality of guide members as seen from above;
• wherein the block member is provided with:
• recesses that expose the grooves of the guide members as seen from above, and are provided for each of the guide members, and
• a circuit board unit temporary placement surface located between each of the recesses that are adjacent to one another as seen from above, and onto which it is possible to temporarily place the circuit board units.