Semiconductor testing device

A semiconductor testing device comprising:

• a signal transmission unit on which a device under test for testing a semiconductor circuit is mounted;
• a plurality of board units electrically connected to the device under test via the signal transmission unit;
• a plurality of power supply units supplying power to the plurality of board units;
• and
• a main body unit, on which the signal transmission unit is mounted, including a first accommodating portion which accommodates the plurality of board units and a second accommodating portion which accommodates the plurality of power supply units, wherein
• the plurality of power supply units are detachably attached to the second accommodating portion, and
• the main body unit includes a bus bar electrically connected to the plurality of power supply units in an attachment/detachment direction of the plurality of power supply units with respect to the second accommodating portion.