G01R 31/2865
Holding devices
Official title: {Holding devices, e.g. chucks; Handlers or transport devices (having contacts G01R31/2863)}
G01R31/2865 (Holding devices) appears on 526 US grants and 572 published applications in this corpus.
Search patents in G01R- Granted patents
- 526
- Published applications
- 572
- Assignees
- 209
- Inventors
- 1,060
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 3 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 3 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 6 | 0 |
| 1993 | 4 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 2 | 0 |
| 1997 | 4 | 0 |
| 1998 | 7 | 0 |
| 1999 | 11 | 0 |
| 2000 | 9 | 0 |
| 2001 | 10 | 1 |
| 2002 | 9 | 11 |
| 2003 | 8 | 9 |
| 2004 | 5 | 21 |
| 2005 | 17 | 15 |
| 2006 | 16 | 14 |
| 2007 | 18 | 23 |
| 2008 | 9 | 20 |
| 2009 | 14 | 7 |
| 2010 | 5 | 16 |
| 2011 | 10 | 5 |
| 2012 | 9 | 6 |
| 2013 | 6 | 9 |
| 2014 | 5 | 16 |
| 2015 | 11 | 19 |
| 2016 | 16 | 16 |
| 2017 | 15 | 20 |
| 2018 | 14 | 29 |
| 2019 | 21 | 24 |
| 2020 | 36 | 48 |
| 2021 | 33 | 40 |
| 2022 | 44 | 53 |
| 2023 | 54 | 54 |
| 2024 | 35 | 29 |
| 2025 | 34 | 36 |
| 2026 | 13 | 31 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Test environment control system22 Sep 2026US 12,742,816 B2Yishi Industrial Co., Ltd
- Electronic component manufacturing method, manufacturing film, and manufacturing tool25 Aug 2026US 12,721,109 B2Mitsui Chemicals Ict Materia, Inc.
- Methods and devices for testing a device under test using test site specific thermal control signaling4 Aug 2026US 12,699,128 B2Advantest Corporation
- Method of having good thermal isolation in wafer test cassette26 May 2026US 12,638,497 B2Xingr Technologies (Zhejiang) Limited
- Modular and adjustable thermal load test vehicle19 May 2026US 12,631,681 B2Microsoft Technology Licensing, LLC
- Probe station device8 Oct 2026US 2026/0309769 A1Korea Basic Science Institute
- Apparatus for testing electronic semiconductor components1 Oct 2026US 2026/0298900 A1
- Carrier, inspection system, and inspection method3 Sep 2026US 2026/0259256 A1Tokyo Electron Limited
- Electronics tester27 Aug 2026US 2026/0251698 A1Aehr Test Systems
- Electronics tester27 Aug 2026US 2026/0251699 A1Aehr Test Systems
Most cited
By later US patents
- Temperature conditioning support for small objects such as semi-conductor components and thermal regulation process using said support177US 5,034,688 AETS Gourdon · 1991
- Electric probing-test machine having a cooling system170US 5,198,752 ATokyo Electron Limited · 1993
- Method and apparatus for the transport and tracking of an electronic component149US 6,644,982 B1FormFactor, Inc. · 2003
- Wafer-level burn-in and test cartridge132US 6,340,895 B12002
- Method for mounting an electronic component113US 6,627,483 B2FormFactor, Inc. · 2003