H01J 37/14
Magnetic
Official title: magnetic
H01J37/14 (Magnetic) appears on 470 US grants and 465 published applications in this corpus.
Search patents in H01J- Granted patents
- 470
- Published applications
- 465
- Assignees
- 145
- Inventors
- 845
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 2 | 0 |
| 1979 | 1 | 0 |
| 1980 | 5 | 0 |
| 1981 | 1 | 0 |
| 1982 | 2 | 0 |
| 1983 | 6 | 0 |
| 1984 | 3 | 0 |
| 1985 | 5 | 0 |
| 1986 | 6 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 8 | 0 |
| 1990 | 7 | 0 |
| 1991 | 8 | 0 |
| 1992 | 1 | 0 |
| 1993 | 3 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 2 | 0 |
| 1997 | 3 | 0 |
| 1998 | 5 | 0 |
| 1999 | 4 | 0 |
| 2000 | 6 | 0 |
| 2001 | 3 | 1 |
| 2002 | 12 | 10 |
| 2003 | 11 | 5 |
| 2004 | 5 | 9 |
| 2005 | 15 | 7 |
| 2006 | 4 | 8 |
| 2007 | 6 | 8 |
| 2008 | 6 | 11 |
| 2009 | 7 | 9 |
| 2010 | 5 | 6 |
| 2011 | 12 | 5 |
| 2012 | 9 | 14 |
| 2013 | 9 | 9 |
| 2014 | 14 | 13 |
| 2015 | 14 | 30 |
| 2016 | 22 | 21 |
| 2017 | 22 | 31 |
| 2018 | 22 | 23 |
| 2019 | 32 | 37 |
| 2020 | 30 | 38 |
| 2021 | 22 | 21 |
| 2022 | 24 | 28 |
| 2023 | 26 | 34 |
| 2024 | 13 | 30 |
| 2025 | 25 | 36 |
| 2026 | 14 | 21 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Fiber Fabry-Perot Cavity laser phase plate for charged particle microscopy1 Sep 2026US 12,725,756 B2FEI Company
- Adjustable permanent magnetic lens having thermal control device11 Aug 2026US 12,706,270 B2IMS Nanofabrication GmbH
- Multiple particle beam system with a mirror mode of operation, method for operating a multiple particle beam system with a mirror mode of operation and associated computer program product14 Jul 2026US 12,683,117 B2Carl Zeiss MultiSEM GmbH
- Charged particle apparatus and method7 Jul 2026US 12,676,278 B2ASML Netherlands B. V.
- Electron microscope7 Jul 2026US 12,676,279 B2Hitachi High-Tech Corporation
- Particle beam microscope24 Sep 2026US 2026/0290747 A1
- Aberration corrector, charged particle beam device including same, and control method for controlling same10 Sep 2026US 2026/0269170 A1Hitachi High-Tech Corporation
- Charged Particle Beam Device6 Aug 2026US 2026/0229443 A1Hitachi High-Tech Corporation
- Objective lens cooling system30 Jul 2026US 2026/0221375 A1ASML Netherlands B. V.
- Charged particle beam device23 Jul 2026US 2026/0213117 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Particle-optical systems and arrangements and particle-optical components for such systems and arrangements98US 7,244,949 B2Applied Materials Israel Ltd. · 2007
- Objective lens, electron beam system and method of inspecting defect56US 7,420,164 B2Ebara Corporation · 2008
- Superconducting PYX structures49US 4,893,103 AThe United States of America as represented by the Secretary of the Army · 1990
- Method and apparatus for uniform charged particle irradiation of a surface48US 4,736,106 AMichigan State University · 1988
- Scanning electron microscope and a method of displaying cross sectional profiles using the same47US 5,057,689 AMatsushita Electric Industrial Co., Ltd. · 1991