H01J 2237/206
Modifying objects while observing
H01J2237/206 (Modifying objects while observing) appears on 205 US grants and 241 published applications in this corpus.
Search patents in H01J- Granted patents
- 205
- Published applications
- 241
- Assignees
- 116
- Inventors
- 561
- Latest grant
- 4 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 2 | 0 |
| 1996 | 6 | 0 |
| 1997 | 2 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 1 |
| 2003 | 2 | 0 |
| 2004 | 2 | 1 |
| 2005 | 0 | 6 |
| 2006 | 2 | 5 |
| 2007 | 4 | 4 |
| 2008 | 6 | 10 |
| 2009 | 3 | 11 |
| 2010 | 6 | 7 |
| 2011 | 8 | 8 |
| 2012 | 10 | 11 |
| 2013 | 5 | 9 |
| 2014 | 17 | 12 |
| 2015 | 7 | 8 |
| 2016 | 9 | 11 |
| 2017 | 12 | 12 |
| 2018 | 15 | 14 |
| 2019 | 9 | 16 |
| 2020 | 14 | 16 |
| 2021 | 10 | 12 |
| 2022 | 9 | 9 |
| 2023 | 8 | 21 |
| 2024 | 10 | 14 |
| 2025 | 11 | 11 |
| 2026 | 6 | 12 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Method and apparatus for continuous chained energy ion implantation4 Aug 2026US 12,700,562 B2Axcelis Technologies, Inc.
- Method of processing ion beam based on optical microscopy imaging21 Jul 2026US 12,688,995 B2Institute of Biophysics, Chinese Academy of Sciences
- Blended energy implant9 Jun 2026US 12,651,722 B2Axcelis Technologies, Inc.
- Processing method and plasma processing apparatus2 Jun 2026US 12,646,693 B2Tokyo Electron Limited
- Transmission electron microscope in-situ chip and preparation method therefor28 Apr 2026US 12,614,694 B2Xiamen Chip-Nova Technology Co., Ltd.
- Method and apparatus for continuous chained energy ion implantation1 Oct 2026US 2026/0302126 A1Axcelis Technologies, Inc.
- Blended energy implant17 Sep 2026US 2026/0279718 A1Axcelis Technologies, Inc.
- Processing method and plasma processing apparatus10 Sep 2026US 2026/0269196 A1Tokyo Electron Limited
- System for the continuous-wave laser processing and sem characterisation of a sample20 Aug 2026US 2026/0245827 A1
- Battery state control during cross-section beam milling18 Jun 2026US 2026/0171345 A1FEI Company
Most cited
By later US patents
- Ion beam preparation device for electron microscopy85US 5,986,264 ABal-Tec A.G. · 1999
- Focused particle beam systems and methods using a tilt column64US 6,039,000 AMicrion Corporation · 2000
- Charged particle beam device probe operation57US 7,319,336 B2Zyvex Instruments, LLC · 2008
- Focused charged beam apparatus, and its processing and observation method55US 5,525,806 ASeiko Instruments Inc. · 1996
- System for analyzing surfaces of samples47US 5,619,035 ABiotechnology Research and Development Corporation · 1997