H01J 2237/2062
Mechanical constraints
H01J2237/2062 (Mechanical constraints) appears on 26 US grants and 29 published applications in this corpus.
Search patents in H01J- Granted patents
- 26
- Published applications
- 29
- Assignees
- 20
- Inventors
- 74
- Latest grant
- 19 Aug 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 1 |
| 2009 | 0 | 1 |
| 2010 | 1 | 0 |
| 2011 | 0 | 1 |
| 2012 | 2 | 0 |
| 2013 | 1 | 1 |
| 2014 | 0 | 1 |
| 2015 | 0 | 0 |
| 2016 | 1 | 1 |
| 2017 | 1 | 2 |
| 2018 | 1 | 1 |
| 2019 | 1 | 2 |
| 2020 | 3 | 5 |
| 2021 | 0 | 1 |
| 2022 | 4 | 2 |
| 2023 | 1 | 4 |
| 2024 | 2 | 1 |
| 2025 | 4 | 4 |
By publication year. Applications have been published since 2001.
Recent patents
- Charged particle beam apparatus19 Aug 2025US 12,394,591 B2JEOL Ltd.
- Device and method for measuring correlation between fatigue performance and microstructure of one-dimensional (1D) nanomaterial in situ in transmission electron microscope (TEM)22 Jul 2025US 12,366,540 B2Beijing University of Technology
- Device for observing permeation and diffusion path of observation target gas, observation target gas measuring method, point-defect location detecting device, point-defect location detecting method, and observation samples27 May 2025US 12,315,696 B2National Institute for Materials Science
- Sample holder and charged particle beam apparatus14 Jan 2025US 12,198,892 B2Hitachi High-Tech Corporation
- Testing assembly including a multiple degree of freedom stage12 Nov 2024US 12,140,571 B2Bruker Nano, Inc.
- Hybrid vacuum electrostatic chuck in vacuum chamber for high warpage wafers25 Dec 2025US 2025/0391692 A1Applied Materials Israel Ltd.
- Hybrid vacuum electrostatic chuck in dedicated chamber for high warpage wafers25 Dec 2025US 2025/0391693 A1Applied Materials Israel Ltd.
- Real-time direct measurement of mechanical properties in-situ of scanning beam microscope24 Apr 2025US 2025/0132125 A1University of Connecticut
- Testing assembly including a multiple degree of freedom stage17 Apr 2025US 2025/0123192 A1Bruker Nano, Inc.
- Device and method for measuring correlation between fatigue performance and microstructure of one-dimensional (1d) nanomaterial in situ in transmission electron microscope (tem)1 Feb 2024US 2024/0035988 A1Beijing University of Technology
Most cited
By later US patents
- Cryogenic temperature control and tension/compression attachment stage for an electron microscope25US 5,355,683 AThe United States of America as represented by the Secretary of the Navy · 1994
- Stress cell for a scanning probe microscope14US 5,500,535 AMolecular Imaging Corporation · 1996
- Double tilt transmission electron microscope sample holder for in-situ measurement of microstructures10US 8,569,714 B2Beijing University of Technology · 2013
- Strain detection for automated nano-manipulation9US 7,395,727 B2Omniprobe, Inc. · 2008
- In situ tensile testing machine and sample for a scanning electron microscope8US 5,606,168 ACentre National De La Recherche Scientifique · 1997