H01J 2237/2067
Surface alteration
H01J2237/2067 (Surface alteration) appears on 35 US grants and 38 published applications in this corpus.
Search patents in H01J- Granted patents
- 35
- Published applications
- 38
- Assignees
- 32
- Inventors
- 129
- Latest grant
- 21 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 1 | 1 |
| 2008 | 0 | 3 |
| 2009 | 0 | 2 |
| 2010 | 1 | 0 |
| 2011 | 1 | 1 |
| 2012 | 1 | 1 |
| 2013 | 0 | 1 |
| 2014 | 2 | 1 |
| 2015 | 1 | 1 |
| 2016 | 2 | 2 |
| 2017 | 0 | 4 |
| 2018 | 6 | 3 |
| 2019 | 3 | 4 |
| 2020 | 4 | 2 |
| 2021 | 1 | 2 |
| 2022 | 2 | 1 |
| 2023 | 0 | 2 |
| 2024 | 1 | 3 |
| 2025 | 1 | 0 |
| 2026 | 1 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method of processing ion beam based on optical microscopy imaging21 Jul 2026US 12,688,995 B2Institute of Biophysics, Chinese Academy of Sciences
- Conductive fixation for electron microscopy11 Feb 2025US 12,224,154 B2University of Kansas
- Specimen imaging systems and methods17 Sep 2024US 12,094,701 B2Georgia Tech Research Corporation
- Device with at least one adjustable sample holder and method of changing holder tilt angle and method of preparing a lamella18 Oct 2022US 11,476,080 B2TESCAN Brno, s.r.o.
- Transmission electron microscope provided with at least one ballistic material jet source1 Feb 2022US 11,239,049 B2Centre National De La Recherche Scientifique
- System for the continuous-wave laser processing and sem characterisation of a sample20 Aug 2026US 2026/0245827 A1
- Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling26 Feb 2026US 2026/0056014 A1Technische Universiteit Delft
- Conductive fixation for electron microscopy12 Feb 2026US 2026/0045445 A1University of Kansas
- Method and System for Sample Preparation26 Dec 2024US 2024/0426717 A1FEI Company
- Specimen imaging systems and methods12 Dec 2024US 2024/0412961 A1Georgia Tech Research Corporation
Most cited
By later US patents
- Ion beam preparation device for electron microscopy85US 5,986,264 ABal-Tec A.G. · 1999
- Focused particle beam systems and methods using a tilt column64US 6,039,000 AMicrion Corporation · 2000
- Focused charged beam apparatus, and its processing and observation method55US 5,525,806 ASeiko Instruments Inc. · 1996
- Systems configured to reduce distortion of a resist during a metrology process and systems and methods for reducing alteration of a specimen during analysis41US 7,304,302 B1KLA-Tencor Technologies Corporation · 2007
- MEMS nanoindenter36US 7,654,159 B2Nanofactory Instruments AB · 2010