Specimen imaging systems and methods

A specimen imaging system comprising:

• a sample stage in a vacuum environment, the sample stage configured to support a specimen;
• an electron beam generator configured to generate an electron beam and focus the electron beam on a first predetermined location on the specimen during a first time period;
• a nanospray dispenser configured to dispense a nanospray onto a second predetermined location on the specimen during a second time period;
• a mass spectrometer;
• and
• an extraction conduit in fluid communication with the mass spectrometer and configured to extract a plume of charged particles generated as a result of contact between the nanospray and the specimen and deliver the charged particles to the mass spectrometer.

A method of imaging a specimen comprising:

• profiling at least a portion of a surface of a specimen within a vacuum environment with an electron beam focused on a first predetermined location on the specimen to obtain a surface topology;
• dispensing a nanospray onto a second predetermined location on the specimen;
• and
• transferring charged particles from a desorbed portion of the specimen to a mass spectrometer.