Blended energy implant
AssigneeAxcelis Technologies, Inc.
InventorsJames S. DeLuca, Dwight Roh, Patrick Heres, Atul Gupta
Life of this patent
Estimating the term…
Loading patent…
AssigneeAxcelis Technologies, Inc.
InventorsJames S. DeLuca, Dwight Roh, Patrick Heres, Atul Gupta
Estimating the term…
Ion implantation systems and methods implant varying energies of an ion beam across a workpiece in a serial single-workpiece end station, where electrodes of an acceleration / deceleration stage, bend electrode and/or energy filter control a final energy or path of the ion beam to the workpiece. The bend electrode or an energy filter can form part of the acceleration / deceleration stage or can be positioned downstream. A scanning apparatus scans the ion beam and/or the workpiece, and a power source provides varied electrical bias signals to the electrodes. A controller selectively varies the electrical bias signals concurrent with the scanning of the ion beam and/or workpiece through the ion beam based on a desired ion beam energy at the workpiece. A waveform generator can provide the variation and synchronize the electrical bias signals supplied to the acceleration / deceleration stage, bend electrode and/or energy filter.
A method for implanting ions into a workpiece with a plurality of sequential implant steps using a single tuning recipe, the method comprising:
An ion implantation system for sequentially implanting ions into a workpiece, the ion implantation system comprising:
A method for implanting ions into a single workpiece with a plurality of sequential implant steps at different predetermined energies using a single tuning recipe, the method comprising:
Dependencies are inferred from the claim text.