G11C 29/34
Accessing multiple bits simultaneously
G11C29/34 (Accessing multiple bits simultaneously) appears on 425 US grants and 180 published applications in this corpus.
Search patents in G11C- Granted patents
- 425
- Published applications
- 180
- Assignees
- 110
- Inventors
- 631
- Latest grant
- 23 Sep 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 3 | 0 |
| 1985 | 3 | 0 |
| 1986 | 1 | 0 |
| 1987 | 6 | 0 |
| 1988 | 4 | 0 |
| 1989 | 5 | 0 |
| 1990 | 5 | 0 |
| 1991 | 9 | 0 |
| 1992 | 6 | 0 |
| 1993 | 12 | 0 |
| 1994 | 13 | 0 |
| 1995 | 21 | 0 |
| 1996 | 15 | 0 |
| 1997 | 27 | 0 |
| 1998 | 25 | 0 |
| 1999 | 41 | 0 |
| 2000 | 19 | 0 |
| 2001 | 23 | 7 |
| 2002 | 20 | 18 |
| 2003 | 20 | 27 |
| 2004 | 17 | 8 |
| 2005 | 9 | 9 |
| 2006 | 8 | 4 |
| 2007 | 5 | 6 |
| 2008 | 9 | 10 |
| 2009 | 7 | 4 |
| 2010 | 5 | 2 |
| 2011 | 2 | 1 |
| 2012 | 4 | 5 |
| 2013 | 1 | 8 |
| 2014 | 12 | 5 |
| 2015 | 2 | 6 |
| 2016 | 5 | 2 |
| 2017 | 5 | 8 |
| 2018 | 7 | 8 |
| 2019 | 10 | 8 |
| 2020 | 7 | 10 |
| 2021 | 8 | 8 |
| 2022 | 8 | 7 |
| 2023 | 6 | 4 |
| 2024 | 4 | 2 |
| 2025 | 2 | 1 |
| 2026 | 0 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- One-time programmable (ROTP) NVM23 Sep 2025US 12,424,294 B2Infineon Technologies AG
- Semiconductor storage apparatus capable of efficiently performing screening test2 Sep 2025US 12,406,746 B2Ablic Inc.
- Embedded memory transparent in-system built-in self-test4 Jun 2024US 12,002,530 B2Synopsys, Inc.
- Masked training and analysis with a memory array9 Apr 2024US 11,954,342 B2Micron Technology, Inc.
- Method of testing memory device, memory built-in self test (MBIST) circuit, and memory device for reducing test time13 Feb 2024US 11,899,959 B2Samsung Electronics Co., Ltd.
- Memory array27 Aug 2026US 2026/0253620 A1Xiamen Industrial Technology Research Institute Co., Ltd.
- Memory generating pass/fail information and operating method of memory11 Jun 2026US 2026/0162748 A1SK hynix Inc.
- Semiconductor memory device and memory system including the same28 Aug 2025US 2025/0273286 A1Samsung Electronics Co., Ltd.
- Memory Testing Techniques25 Apr 2024US 2024/0136006 A1Arm Limited
- Semiconductor storage apparatus29 Feb 2024US 2024/0071551 A1Ablic Inc.
Most cited
By later US patents
- Flash eeprom system602US 5,297,148 ASunDisk Corporation · 1994
- Flash EEprom system524US 5,602,987 ASanDisk Corporation · 1997
- Using storage cells to perform computation457US 8,238,173 B2Zikbit Ltd. · 2012
- Flash EEPROM system with erase sector select437US 5,418,752 ASunDisk Corporation · 1995
- Semiconductor memory device having multi-bit testing function424US 6,816,422 B2Renesas Technology Corp. · 2004