Electrical testing of internal connections or -isolation

Official title: {Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections (G01R31/31717 takes precedence; test of chip-to-PCB or lead-to-PCB connections G01R31/66)}

G01R31/2853 (Electrical testing of internal connections or -isolation) appears on 730 US grants and 668 published applications in this corpus.