Integrated circuit testing system and method

An integrated circuit testing system comprising:

• a plurality of conductive structures coupled to a conductive line;
• a plurality of test circuits each individually coupled to a different conductive structure of the plurality of conductive structures, each of the plurality of test circuits configured to send a feedback indicative of whether each of the different conductive structures is capable of carrying a test voltage individually supplied by each of the test circuits;
• a controller coupled to each of the test circuits of the plurality of test circuits, wherein the controller generates a report based on received connectivity information;
• and
• a plurality of readout circuits, wherein each readout circuit of the plurality of readout circuits is configured to receive the feedback and to provide the connectivity information to the controller, and each of the plurality of readout circuits is electrically between a corresponding test circuit of the plurality of test circuits and the controller.

A method of testing an integrated circuit, the method comprising:

• directly physically contacting a conductive line with a first conductive structure, wherein the conductive line is connected to a reference voltage;
• supplying a first test voltage to the conductive line through the first conductive structure;
• measuring a current flow through the first conductive structure based on the first test voltage independent of current flowing through any other conductive structure contacting the conductive line;
• and
• generating a report indicating whether the first conductive structure is capable of carrying the first test voltage based on feedback from a first test circuit connected to the first conductive structure.