G01N 2223/07
Secondary emission
Official title: secondary emission
G01N2223/07 (Secondary emission) appears on 1,179 US grants and 1,068 published applications in this corpus.
Search patents in G01N- Granted patents
- 1,179
- Published applications
- 1,068
- Assignees
- 601
- Inventors
- 2,468
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 17 | 0 |
| 1977 | 10 | 0 |
| 1978 | 8 | 0 |
| 1979 | 7 | 0 |
| 1980 | 7 | 0 |
| 1981 | 12 | 0 |
| 1982 | 17 | 0 |
| 1983 | 11 | 0 |
| 1984 | 15 | 0 |
| 1985 | 9 | 0 |
| 1986 | 11 | 0 |
| 1987 | 12 | 0 |
| 1988 | 6 | 0 |
| 1989 | 8 | 0 |
| 1990 | 7 | 0 |
| 1991 | 9 | 0 |
| 1992 | 11 | 0 |
| 1993 | 10 | 0 |
| 1994 | 11 | 0 |
| 1995 | 11 | 0 |
| 1996 | 11 | 0 |
| 1997 | 7 | 0 |
| 1998 | 11 | 0 |
| 1999 | 3 | 0 |
| 2000 | 17 | 0 |
| 2001 | 16 | 5 |
| 2002 | 32 | 25 |
| 2003 | 24 | 29 |
| 2004 | 18 | 23 |
| 2005 | 22 | 29 |
| 2006 | 22 | 35 |
| 2007 | 23 | 25 |
| 2008 | 34 | 48 |
| 2009 | 36 | 55 |
| 2010 | 39 | 26 |
| 2011 | 31 | 28 |
| 2012 | 16 | 23 |
| 2013 | 28 | 38 |
| 2014 | 24 | 37 |
| 2015 | 30 | 35 |
| 2016 | 35 | 35 |
| 2017 | 32 | 46 |
| 2018 | 32 | 21 |
| 2019 | 26 | 48 |
| 2020 | 41 | 66 |
| 2021 | 63 | 95 |
| 2022 | 68 | 92 |
| 2023 | 65 | 72 |
| 2024 | 60 | 56 |
| 2025 | 70 | 49 |
| 2026 | 34 | 27 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 2223/076X-ray fluorescenceIndexing code880
- G01N 2223/074Activation analysisIndexing code102
- G01N 2223/079Incident electron beam and measuring excited x-raysIndexing code72
- G01N 2223/071Combination of measurements, at least 1 secondary emissionIndexing code62
- G01N 2223/085Photo-electron spectrum [esca, xps]Indexing code26
- G01N 2223/072Combination of measurements, 2 kinds of secondary emissionIndexing code18
- G01N 2223/081Incident ion beamIndexing code15
- G01N 2223/08Incident electron beam and measuring cathode luminescenceIndexing code10
Recent patents
- Apparatus for analyzing composition and method thereof6 Oct 2026US 12,754,152 B23I Solution Inc.
- Method and system for determining physical properties of rocky formations6 Oct 2026US 12,754,153 B2Geolog S.r.l.
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Pipeline inspection apparatus comprising multiple barrel sections, articulating components, and radially extending structures18 Aug 2026US 12,710,561 B2Under Cover Technologies Corp.
- Particle-induced x-ray emission using light and heavy particle beams11 Aug 2026US 12,704,469 B2FEI Company
- Tomographic imaging system geometry to mitigate artifacts1 Oct 2026US 2026/0298845 A1
- Measurement head and gauge for improved measurement stability24 Sep 2026US 2026/0287524 A1Thermo Fisher Scientific Messtechnik GmbH
- Adaptive fudicials for mult-modal radiotherapy17 Sep 2026US 2026/0272604 A2IZI Medical Products
- Crystal evaluation method17 Sep 2026US 2026/0282842 A1Kioxia Corporation
- System and method for x-ray fluorescence inspection of light elements27 Aug 2026US 2026/0251595 A1Rigaku Semiconductor Instruments Ltd.
Most cited
By later US patents
- Dynamic radiation therapy simulation system114US 7,349,522 B2Board of Trustees of the University of Arkansas · 2008
- Mobile miniature X-ray source98US 6,661,876 B2Moxtek, Inc. · 2003
- Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF)97US 5,778,039 AAdvanced Micro Devices, Inc. · 1998
- Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer96US 5,742,658 AAdvanced Micro Devices, Inc. · 1998
- X-ray fluorescence combined with laser induced photon spectroscopy93US 6,801,595 B2Niton Corporation · 2004