G01N 2223/076
X-ray fluorescence
G01N2223/076 (X-ray fluorescence) appears on 880 US grants and 772 published applications in this corpus.
Search patents in G01N- Granted patents
- 880
- Published applications
- 772
- Assignees
- 441
- Inventors
- 1,619
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 13 | 0 |
| 1977 | 6 | 0 |
| 1978 | 7 | 0 |
| 1979 | 5 | 0 |
| 1980 | 3 | 0 |
| 1981 | 4 | 0 |
| 1982 | 9 | 0 |
| 1983 | 8 | 0 |
| 1984 | 10 | 0 |
| 1985 | 7 | 0 |
| 1986 | 6 | 0 |
| 1987 | 9 | 0 |
| 1988 | 3 | 0 |
| 1989 | 5 | 0 |
| 1990 | 4 | 0 |
| 1991 | 7 | 0 |
| 1992 | 7 | 0 |
| 1993 | 7 | 0 |
| 1994 | 6 | 0 |
| 1995 | 11 | 0 |
| 1996 | 9 | 0 |
| 1997 | 7 | 0 |
| 1998 | 11 | 0 |
| 1999 | 3 | 0 |
| 2000 | 16 | 0 |
| 2001 | 16 | 5 |
| 2002 | 32 | 25 |
| 2003 | 24 | 28 |
| 2004 | 18 | 23 |
| 2005 | 22 | 29 |
| 2006 | 21 | 33 |
| 2007 | 23 | 23 |
| 2008 | 29 | 47 |
| 2009 | 36 | 54 |
| 2010 | 38 | 23 |
| 2011 | 31 | 26 |
| 2012 | 14 | 22 |
| 2013 | 28 | 34 |
| 2014 | 22 | 30 |
| 2015 | 27 | 31 |
| 2016 | 28 | 23 |
| 2017 | 23 | 37 |
| 2018 | 24 | 15 |
| 2019 | 21 | 41 |
| 2020 | 34 | 38 |
| 2021 | 46 | 39 |
| 2022 | 27 | 42 |
| 2023 | 37 | 36 |
| 2024 | 31 | 29 |
| 2025 | 30 | 26 |
| 2026 | 15 | 13 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Method and system for determining physical properties of rocky formations6 Oct 2026US 12,754,153 B2Geolog S.r.l.
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Holder, analysis apparatus including the same, and battery analysis method21 Jul 2026US 12,687,507 B2Shimadzu Corporation
- Analysis system, analysis device, and control method14 Jul 2026US 12,680,971 B2Shimadzu Corporation
- X-ray fluorescence analyzer and power supply device16 Jun 2026US 12,660,071 B2Shimadzu Corporation
- Measurement head and gauge for improved measurement stability24 Sep 2026US 2026/0287524 A1Thermo Fisher Scientific Messtechnik GmbH
- System and method for x-ray fluorescence inspection of light elements27 Aug 2026US 2026/0251595 A1Rigaku Semiconductor Instruments Ltd.
- Method and device for carrying out a spectral analysis for determining a spectrum of a sample16 Jul 2026US 2026/0202363 A1
- Smart systems and methods for identification and processing of spent lithium cells9 Jul 2026US 2026/0194476 A1Li Industries, Inc.
- Systems and methods for improved material sample analysis and quality control7 May 2026US 2026/0125578 A1Decision Tree, LLC
Most cited
By later US patents
- Dynamic radiation therapy simulation system114US 7,349,522 B2Board of Trustees of the University of Arkansas · 2008
- Mobile miniature X-ray source98US 6,661,876 B2Moxtek, Inc. · 2003
- Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF)97US 5,778,039 AAdvanced Micro Devices, Inc. · 1998
- Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer96US 5,742,658 AAdvanced Micro Devices, Inc. · 1998
- X-ray fluorescence combined with laser induced photon spectroscopy93US 6,801,595 B2Niton Corporation · 2004