Measurement head and gauge for improved measurement stability
AssigneeThermo Fisher Scientific Messtechnik GmbH
InventorsAlexander Britting, Florian Woelfel
Life of this patent
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Abstract
A first aspect of the invention provides a measurement head comprising a radiation source, configured to emit a first radiation beam and a second radiation beam; a segmented chamber; a first radiation detector positioned in a first segment of the segmented chamber and configured to generate a first voltage signal responsive to the first radiation beam; and a second radiation detector positioned in a second segment of the segmented chamber and configured to generate a second voltage signal responsive to material specific radiation produced from an interaction with the second radiation beam.
Claims20
A measurement head comprising:
- a radiation source, configured to emit a first radiation beam and a second radiation beam;
- a segmented chamber;
- a first radiation detector positioned in a first segment of the segmented chamber and configured to generate a first voltage signal responsive to the first radiation beam;
- and
- a second radiation detector positioned in a second segment of the segmented chamber and configured to generate a second voltage signal responsive to material specific radiation produced from an interaction with the second radiation beam.
A method for compensating variation in a measurement head, the method comprising:
- sampling a first voltage signal responsive to a first radiation beam from a first radiation detector at a time t;
- sampling a second voltage signal responsive to a second radiation beam from a second radiation detector at the time t;
- normalizing the samples of the first and second voltage signals;
- storing the normalized sample of the first voltage signal taken at the time t;
- determining a compensation factor;
- and
- determining a compensated second voltage signal by multiplying the sample of the second voltage signal taken at the time t by the compensation factor.
A non-transitory computer-readable medium having stored thereon instructions that, when executed by a processor, cause the processor to perform a method comprising:
- sampling a first voltage signal responsive to a first radiation beam from a first radiation detector at a time t;
- sampling a second voltage signal responsive to a second radiation beam from a second radiation detector at the time t;
- normalizing the samples of the first and second voltage signal;
- storing the normalized sample of the first voltage signal taken at the time t;
- determining a compensation factor;
- and
- determining a compensated second voltage signal by multiplying the sample of the second voltage signal taken at the time t by the compensation factor.
A gauge comprising:
- a measurement head comprising:
- a radiation source, configured to emit a first radiation beam and a second radiation beam;
- and
- a first radiation detector positioned adjacent to the radiation source and configured to generate a first voltage signal responsive to the first radiation beam;
- a measurement portion, arranged to receive the material, such that the material is in the path of the second radiation beam that interacts with the material to produce a material specific radiation;
- and
- a second radiation detector configured to generate a second voltage signal responsive to the material specific radiation, wherein the measurement portion is positioned between the radiation source and the second radiation detector.
Dependencies are inferred from the claim text.