G01N 2223/00
Investigating materials by wave or particle radiation
G01N2223/00 (Investigating materials by wave or particle radiation) appears on 5,610 US grants and 6,386 published applications in this corpus.
Search patents in G01N- Granted patents
- 5,610
- Published applications
- 6,386
- Assignees
- 2,043
- Inventors
- 11,883
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 20 | 0 |
| 1977 | 14 | 0 |
| 1978 | 10 | 0 |
| 1979 | 7 | 0 |
| 1980 | 9 | 0 |
| 1981 | 13 | 0 |
| 1982 | 18 | 0 |
| 1983 | 15 | 0 |
| 1984 | 20 | 0 |
| 1985 | 12 | 0 |
| 1986 | 15 | 0 |
| 1987 | 22 | 0 |
| 1988 | 13 | 0 |
| 1989 | 18 | 0 |
| 1990 | 20 | 0 |
| 1991 | 30 | 0 |
| 1992 | 24 | 0 |
| 1993 | 16 | 0 |
| 1994 | 23 | 0 |
| 1995 | 40 | 0 |
| 1996 | 32 | 0 |
| 1997 | 28 | 0 |
| 1998 | 49 | 0 |
| 1999 | 32 | 0 |
| 2000 | 50 | 0 |
| 2001 | 70 | 18 |
| 2002 | 79 | 63 |
| 2003 | 59 | 75 |
| 2004 | 62 | 100 |
| 2005 | 65 | 125 |
| 2006 | 99 | 121 |
| 2007 | 101 | 160 |
| 2008 | 117 | 146 |
| 2009 | 126 | 160 |
| 2010 | 123 | 125 |
| 2011 | 117 | 145 |
| 2012 | 96 | 143 |
| 2013 | 124 | 218 |
| 2014 | 144 | 286 |
| 2015 | 226 | 274 |
| 2016 | 219 | 254 |
| 2017 | 245 | 354 |
| 2018 | 256 | 282 |
| 2019 | 308 | 361 |
| 2020 | 381 | 412 |
| 2021 | 356 | 440 |
| 2022 | 339 | 452 |
| 2023 | 341 | 449 |
| 2024 | 348 | 456 |
| 2025 | 392 | 414 |
| 2026 | 267 | 353 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 2223/60Specific applications or type of materialsIndexing code2,503
- G01N 2223/40ImagingIndexing code2,477
- G01N 2223/30Accessories, mechanical or electrical featuresIndexing code1,541
- G01N 2223/07Secondary emissionIndexing code1,179
- G01N 2223/10Different kinds of radiation or particlesIndexing code586
- G01N 2223/50DetectorsIndexing code473
- G01N 2223/05Investigating materials by wave or particle radiation: by diffraction, scatter or reflectionIndexing code465
- G01N 2223/03Investigating materials by wave or particle radiation: by transmissionIndexing code260
Recent patents
- System and method for multi-axis imaging of specimens6 Oct 2026US 12,752,276 B2Faxitron Bioptics, LLC
- X-ray inspection apparatus6 Oct 2026US 12,754,147 B2Ishida Co., Ltd.
- Systems and methods for using multi-dimensional X-ray imaging in meat production and processing applications6 Oct 2026US 12,754,148 B2Rapiscan Holdings, Inc.
- Attitude adjustment structure, conveying device, radiation imaging system6 Oct 2026US 12,754,149 B2Nuctech Company Limited
- Overlay target measurement and shift compensation in charged particle systems and related methods6 Oct 2026US 12,754,150 B2Applied Materials Israel Ltd.
- Battery cell inspection apparatus, battery cell inspection method, and battery cell inspection system8 Oct 2026US 2026/0309647 A1SK On Co., Ltd.
- X-ray inspection apparatus8 Oct 2026US 2026/0309648 A1Anritsu Corporation
- Image processing apparatus, image processing method, and image processing program8 Oct 2026US 2026/0309650 A1FUJIFILM Corporation
- Method for scanning an object in a scanning apparatus8 Oct 2026US 2026/0309651 A1ROLLS-ROYCE plc
- X-ray transmission inspection apparatus and x-ray transmission inspection method8 Oct 2026US 2026/0309652 A1Hitachi High-Tech Science Corporation
Most cited
By later US patents
- Computed tomography metrology496US 5,848,115 AGeneral Electric Company · 1998
- Systems and methods for imaging large field-of-view objects486US 7,108,421 B2Breakaway Imaging, LLC · 2006
- Method for reconstructing a three-dimensional image volume and x-ray devices347US 7,711,083 B2Siemens Aktiengesellschaft · 2010
- Means for localizing target coordinates in a body relative to a guidance system reference frame in any arbitrary plane as viewed by a tomographic image through the body337US 4,618,978 A1986
- Computed tomography with increased field of view337US 7,062,006 B1Nova Ray, Inc. · 2006