G01N 2223/045
Combination of at least 2 measurements
Official title: combination of at least 2 measurements (transmission and scatter)
G01N2223/045 (Combination of at least 2 measurements) appears on 53 US grants and 66 published applications in this corpus.
Search patents in G01N- Granted patents
- 53
- Published applications
- 66
- Assignees
- 52
- Inventors
- 169
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 2 |
| 2009 | 2 | 3 |
| 2010 | 0 | 0 |
| 2011 | 2 | 0 |
| 2012 | 0 | 2 |
| 2013 | 1 | 1 |
| 2014 | 0 | 1 |
| 2015 | 1 | 3 |
| 2016 | 0 | 3 |
| 2017 | 5 | 7 |
| 2018 | 3 | 1 |
| 2019 | 5 | 6 |
| 2020 | 2 | 4 |
| 2021 | 4 | 6 |
| 2022 | 7 | 9 |
| 2023 | 8 | 4 |
| 2024 | 6 | 6 |
| 2025 | 2 | 5 |
| 2026 | 4 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Information processing system and phase analysis system7 Jul 2026US 12,676,287 B2Hitachi, Ltd.
- Systems and methods for signal electron detection17 Feb 2026US 12,555,738 B2ASML Netherlands B. V.
- Inspection tool, inspection tool operating method, and non-transitory computer readable medium10 Feb 2026US 12,546,731 B1ASML Netherlands B. V.
- Systems and methods for inspection portals14 Oct 2025US 12,442,779 B2Smiths Detection Inc.
- Measurement system for and method of measuring moving web13 Aug 2026US 2026/0235537 A1Valmet Automation Oy
- Improved time-of-flight x-ray imaging using tpsf25 Jun 2026US 2026/0177710 A1Socpra Sciences Et Genie S. E. C.
- Method and System for Detecting a Material14 Aug 2025US 2025/0258116 A1Viken Detection Corporation
- Device for measuring elemental and molecular properties with hybrid electromagnetic waves31 Jul 2025US 2025/0244234 A1Haus Sps Makina Elektronik Bilisim Sanayi Ve Ticaret Anonim Sirketi
- Inspection device, inspection element, and inspection method17 Jul 2025US 2025/0231124 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- X-ray transmission spectrometer system39US 10,295,485 B2Sigray, Inc. · 2019
- Apparatus for inspecting objects using coded beam21US 7,623,614 B2Thermo Niton Analyzers LLC · 2009
- Monochromatic attenuation contrast image generation by using phase contrast CT18US 9,842,414 B2Koninklijke Philips N. V. · 2017
- Annihilation radiation analysis14US 4,415,804 AAustralian Atomic Energy Commission · 1983
- X-ray topography apparatus10US 9,658,174 B2Rigaku Corporation · 2017