Systems and methods for inspection portals
AssigneeSmiths Detection Inc.
InventorJoseph Bendahan
Life of this patent
Estimating the term…
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AssigneeSmiths Detection Inc.
InventorJoseph Bendahan
Estimating the term…
An inspection portal includes a first x-ray source configured to emit a first beam, a first backscatter detector configured to detect backscatter from the first beam, a second x-ray source configured to emit a second beam, a second backscatter detector configured to detect backscatter from the second beam, and at least one first collimator and at least one second collimator, each oriented to detect backscatter from the associated beam and to block scatter from the other beam. The first and second backscatter detectors are configured to weight signals acquired using each of their detector element based on the first and second beams. The first backscatter detector is configured to use signal processing techniques to mitigate crosstalk due to scatter from the second beam, and the second backscatter detector is configured to use the signal processing techniques to mitigate crosstalk due to scatter from the first beam.
An inspection portal for imaging an object, said inspection portal comprising:
An inspection portal for imaging an object, said inspection portal comprising:
An inspection portal for imaging an object, said inspection portal comprising:
Dependencies are inferred from the claim text.