X-ray inspection apparatus
AssigneeIshida Co., Ltd.
InventorKota Tominaga
Life of this patent
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AssigneeIshida Co., Ltd.
InventorKota Tominaga
Estimating the term…
An X-ray inspection apparatus includes: a conveying unit; an irradiation unit configured to irradiate an article with an electromagnetic wave; a detection unit configured to detect the electromagnetic wave transmitted through the article; an inspection unit configured to inspect the article; and a determination unit configured to determine attachment of the conveying unit. The conveying unit includes first and second conveying units. The determination unit includes: a support portion attached to the first conveying unit; a swing member swingably attached to the second conveying unit and at least partially in contact with the support portion when the first and second conveying units are attached; and a sensor unit configured to detect whether the swing member is present at a predetermined position in a state where the swing member is in contact with the support portion.
An X-ray inspection apparatus comprising:
Dependencies are inferred from the claim text.