G01N 2223/05
Investigating materials by wave or particle radiation: by diffraction, scatter or reflection
Official title: by diffraction, scatter or reflection
G01N2223/05 (Investigating materials by wave or particle radiation: by diffraction, scatter or reflection) appears on 465 US grants and 550 published applications in this corpus.
Search patents in G01N- Granted patents
- 465
- Published applications
- 550
- Assignees
- 279
- Inventors
- 1,296
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 2 | 0 |
| 1984 | 3 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 3 | 0 |
| 1994 | 2 | 0 |
| 1995 | 5 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 2 |
| 2006 | 2 | 1 |
| 2007 | 1 | 3 |
| 2008 | 0 | 5 |
| 2009 | 2 | 4 |
| 2010 | 2 | 0 |
| 2011 | 1 | 3 |
| 2012 | 1 | 4 |
| 2013 | 2 | 11 |
| 2014 | 2 | 14 |
| 2015 | 12 | 19 |
| 2016 | 15 | 17 |
| 2017 | 22 | 43 |
| 2018 | 20 | 29 |
| 2019 | 35 | 39 |
| 2020 | 40 | 40 |
| 2021 | 37 | 64 |
| 2022 | 47 | 77 |
| 2023 | 57 | 65 |
| 2024 | 61 | 45 |
| 2025 | 51 | 37 |
| 2026 | 32 | 27 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 2223/056DiffractionIndexing code204
- G01N 2223/053Back scatterIndexing code111
- G01N 2223/054Small angle scatterIndexing code68
- G01N 2223/052ReflectionIndexing code45
- G01N 2223/051Correcting for scatterIndexing code19
- G01N 2223/063Inelastic scatterIndexing code19
- G01N 2223/064Interference of radiationIndexing code14
- G01N 2223/055Scatter raster collimatorIndexing code5
Recent patents
- Image analyzer for material structure using Fourier transform and principal component analysis6 Oct 2026US 12,755,511 B2Toyota Jidosha Kabushiki Kaisha
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Methods and systems for model-less, scatterometry based measurements of semiconductor structures22 Sep 2026US 12,743,027 B2KLA Corporation
- Differentiation of clastic sedimentary systems using March-Dollase preferred orientation actor15 Sep 2026US 12,736,486 B2Saudi Arabian Oil Company
- Radio wave absorber and radio wave absorbing composition15 Sep 2026US 12,738,665 B2FUJIFILM Corporation
- Device for Contactless Measurement of the Microstructure of Moving Material Webs1 Oct 2026US 2026/0298848 A1IMS Messsysteme GmbH
- Measurement head and gauge for improved measurement stability24 Sep 2026US 2026/0287524 A1Thermo Fisher Scientific Messtechnik GmbH
- Backscatter Scanning Systems with Different Detector Panel Configurations17 Sep 2026US 2026/0276858 A1American Science and Engineering, Inc.
- Alloy composition calculation apparatus, method, program, and system27 Aug 2026US 2026/0251586 A1Resonac Corporation
- Method and program for calculating small-angle x-ray scattering intensity distribution6 Aug 2026US 2026/0227349 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Optical measuring device66US 7,003,075 B2Canon Kabushiki Kaisha · 2006
- Hidden explosives detector employing pulsed neutron and x-ray interrogation63US 5,200,626 AMartin Marietta Energy Systems, Inc. · 1993
- High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors62US 8,831,176 B2Rapiscan Systems, Inc. · 2014
- X-ray interferometer for phase contrast imaging55US 8,041,004 B2Paul Scherrer Institut · 2011
- X-ray measurement of properties of nano-particles52US 7,680,243 B2Jordan Valley Semiconductors Ltd. · 2010