G01N 2223/051
Correcting for scatter
Official title: correcting for scatter
G01N2223/051 (Correcting for scatter) appears on 19 US grants and 24 published applications in this corpus.
Search patents in G01N- Granted patents
- 19
- Published applications
- 24
- Assignees
- 20
- Inventors
- 55
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2013 | 0 | 2 |
| 2014 | 0 | 0 |
| 2015 | 1 | 1 |
| 2016 | 1 | 2 |
| 2017 | 1 | 3 |
| 2018 | 2 | 1 |
| 2019 | 0 | 3 |
| 2020 | 2 | 1 |
| 2021 | 3 | 3 |
| 2022 | 2 | 3 |
| 2023 | 4 | 2 |
| 2024 | 2 | 2 |
| 2025 | 0 | 1 |
| 2026 | 1 | 0 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Determining tilt angle of substrate structures utilizing angular fourier decomposition of scattering images25 Aug 2026US 12,716,854 B2APPLIED Materials.Inc.
- Method and system to determine crystal structure21 May 2024US 11,988,618 B2FEI Company
- X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate9 Jan 2024US 11,867,595 B2Industrial Technology Research Institute
- Methods for x-ray imaging of a subject using multiple-energy decomposition19 Dec 2023US 11,844,640 B2Xenselab, LLC
- Methods and systems for acquiring three-dimensional electron diffraction data14 Nov 2023US 11,815,476 B2FEI Company
- Determining tilt angle of substrate structures utilizing angular fourier decomposition of scattering images24 Apr 2025US 2025/0130183 A1APPLIED Materials.Inc.
- Method and apparatus for using radiation imaging data to analyze components7 Nov 2024US 2024/0369500 A1Rtx Corporation
- Methods for x-ray imaging of a subject using multiple-energy decomposition11 Jul 2024US 2024/0225575 A1Xenselab, LLC
- Methods for x-ray imaging of a subject using multiple-energy decomposition16 Mar 2023US 2023/0084604 A1Xenselab, LLC
- Estimation of full-field scattering for dax imaging5 Jan 2023US 2023/0000453 A1Koninklijke Philips N. V.
Most cited
By later US patents
- Methods for x-ray imaging of a subject using multiple-energy decomposition6US 11,298,095 B2Xenselab, LLC · 2022
- Imaging system and method with scatter correction5US 9,804,106 B2General Electric Company · 2017
- X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate3US 11,579,099 B2Industrial Technology Research Institute · 2023
- Method for estimation and correction of grid pattern due to scatter2US 10,098,603 B2Toshiba Medical Systems Corporation · 2018
- Method and apparatus for X-ray scatterometry2US 10,684,238 B2Bruker Technologies Ltd. · 2020