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AssigneeKoninklijke Philips N.V.
InventorsSVEN PETER PREVRHAL, THOMAS KOEHLER, KLAUS JUERGEN ENGEL
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An X-ray imaging system (XI) configured for phase contrast and/or dark-field imaging The system comprises an X-ray source (XS) operable to cause X-radiation to emanate from a focal spot (SF) of the source (XS) and an X-ray sensitive detector (D) operable to SMF detect the X-radiation after interaction of said X-radiation with an object to be imaged, if present, between the X-ray source and the detector (D). A control logic (CL) is operable to cause the X-ray imaging apparatus to operate in any one of two modes, an object image acquisition mode and a scattering measurement mode. When in scattering measurement mode, the X-radiation receivable at the detector comprises a higher proportion of scattering radiation than in X-radiation receivable when the system is in object image acquisition mode.
An X-ray imaging system configured for phase contrast and/or dark-field imaging, comprising:
A method, comprising:
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A non-transitory computer-readable medium for storing executable instructions, which cause a method to be performed to process data in phase contrast and/or dark-field imaging, the method comprising:
Dependencies are inferred from the claim text.